Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-27T03:38:24.559Z Has data issue: false hasContentIssue false

Analysis of Portland Cement, Clinker, Raw Mix, and Associated Ceramic Materials Using an Energy Dispersive X-Ray Fluorescence Analyzer With Interelement Corrections

Published online by Cambridge University Press:  06 March 2019

J. A. Cooper
Affiliation:
ORTEC, Incorporated Oak Ridge, Tennessee 37830
B. D. Wheeler
Affiliation:
ORTEC, Incorporated Oak Ridge, Tennessee 37830
D. M. Bartell
Affiliation:
ORTEC, Incorporated Oak Ridge, Tennessee 37830
D. A. Gedcke
Affiliation:
ORTEC, Incorporated Oak Ridge, Tennessee 37830
Get access

Abstract

A rapid multielement analysis procedure for cement and ceramic type materials has been developed which uses pelletized powders and an exponential correction to the observed x-ray intensities. Only the more significant interactions are considered in an iterative process requiring a minimum of standards. The interaction coefficients are determined by a nonlinear multiple least squares fit of the standards. Average deviations obtained for the analysis of light elements in cement ranged from a low of 0.006% for K2O to a high of 0.13% absolute for SiO2.

Type
Mathematical Correction Procedures for X-Ray Spectrochemical Analysis
Copyright
Copyright © International Centre for Diffraction Data 1975

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Beattie, H. J. and Brissey, R. M., Anal. Chem. 26, 980 (1954).Google Scholar
2. Sherman, J., “The Theoretical Derivation of Fluorescent X-Ray Intensities From Mixtures”, Spectrochimica Acta, Vol. 7, p 283306, Pergamon Press Ltd., London (1955).Google Scholar
3. Andermann, G. and Allen, J. D., “X-Ray Emission Analysis of Finished Cements”, Anal. Chem. 33, 1965 (1961).Google Scholar
4. Andermann, G., “Improvements in the X-Ray Emission Analysis of Cement Raw Mix”, Anal. Chem. 33, 1689 (1961).Google Scholar
5. Meyer, J. W., “Determination of Iron, Calcium, and Silicon in Calcium Silicates by X-Ray Fluorescence”, Anal. Chem. 33, 692 (1961).Google Scholar
6. Lucas-Tooth, H. J. and Price, B. J., “A Mathematical Method for the Investigation of Interelement Effects in X-Ray Fluorescent Analyses”, Lab. Meth., Vol. LXIV, No. 383, p. 147151 (1961).Google Scholar
7. Andermann, G., Kemp, J. W., and Hasler, M. F., “The Application of a Vacuum X-Ray Quantometer To Nonmetallic Matrices”, Proceedings of International Colloquium on Spectroscopy, June (1961).Google Scholar
8. Tooth, J. L. and Pyne, C., “The Accurate Determination of Major Constituents by X-Ray Fluorescent Analysis In The Presence of Large Interelement Effects”, Advances in X-Ray Analysis, Vol. 7, p. 523541 (1963).Google Scholar
9. Lachance, G. R. and Traill, R. J., Can. Spectrosc. 11, 43 (1966).Google Scholar
10. Wheeler, B. D., “Cement Raw Mix Control Through X-Ray Emission Spectroscopy”, Proceedings of Third Forum on Geology of Industrial Minerals, April (1967).Google Scholar
11. Lubecki, A., “Theoretical Discussion of Methods of Elimination of Matrix Effects In Non-Dispersive X-Ray Analysis”, Radioana, J.. Chem. 2, 318 (1969).Google Scholar
12. Tertian, R., “Quantitative Analysis With X-Ray Fluorescence Spectrometry - An Accurate and General Mathematical Correction Method For The Interelement Effects”, Spectrochimica Acta, Vol. 24B, P. 447471, Pergamon Press (1969).Google Scholar
13. Jenkins, R., Croke, J. F., Niemann, R. L., and Westberg, R. G., in Pickles, W. L., Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. IS, p. 372381, Plenum Press (1974).Google Scholar
14. Rousseau, R. and Claisse, F., “Theoretical Alpha Coefficients for The Claisse-Quintin Relation for X-Ray Spectrochemical Analysis”, X-Ray Spectrometry 3, 3136 (1974).Google Scholar
15. Rasberry, S. D. and Henrich, K. F. J., “Calibration for I rvtere lenient Effects in X-Ray Fluorescence Analysis”, Ana. Chem. 46, 81 (1974).Google Scholar
16. Spex Industries, P. O. Box 798, Metuchen, NJ 08840.Google Scholar