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An X-Ray Determination of the Debyewaller Factors for Cu2O and UO2 and the Atomic Scattering Factor for Cu in Cu2O

Published online by Cambridge University Press:  06 March 2019

C. J. Sparks Jr.
Affiliation:
Oak Ridge National Laboratory*, Oak Ridge, Tennessee
B. S. Borie
Affiliation:
Oak Ridge National Laboratory*, Oak Ridge, Tennessee
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Abstract

The Debye-Waller factor for CuaO and the atomic scattering factor for copper were determined independently of each other at one temperature from measurements of both the diffuse scattering and the integrated intensities of the Bragg maxima. The scattering factor agreed well with that computed from theory. The characteristic temperature computed from the Debye-Waller factor at 298°K was found to be 182°K. At 88°K its value is 152°K.

Similar measurements of the Bragg maxima with a powder sample of UO2 were not useful because of preferred orientation. However, the diffuse intensity is not so sensitive to preferred orientation and may be used to determine the characteristic temperature. Its value for UO2 was found to be 188°K at room temperature.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1962

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