Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-19T22:42:06.447Z Has data issue: false hasContentIssue false

An Ultrahigh-Temperature, Single-Crystal Texture Camera Diffractometer*

Published online by Cambridge University Press:  06 March 2019

Robert L. Prickett*
Affiliation:
Air Force Materials Laboratory Wright-Patterson AFB, Ohio
Get access

Abstract

A single-crystal high-temperature X-ray camera has been built with permissible operating temperatures of 2500°C. The camera is constructed to rest upon a Siemens horizontal diffractometer and may be used with either an external electronic detector or with film. The sample is supported on an externally adjustable goniometer head and is heated from the back by an ion beam. Controlled oscillation allows rotation photographs to be obtained from the sample surface not touched by the ion stream. Temperature is controlled by a thermocouple supporting the sample, the thermocouple being an intrinsic part of the goniometer. As a design limit, zero and first order layer lines with iron Kα. radiation on specimens with lattice parameters of 2.6 Å or larger may be recorded. Copper, cobalt, and molybdenum radiation allow even greater latitude. Types of samples that may be studied include powder (pellet), single crystal, wire, or rod. The camera serves equally well for single-crystal, texture, or powder studies on refractory materials.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1964

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

All rights reserved by the U.S. Air Force, Air Force Materials Laboratory.

References

1. Hume-Rothery, W. and Reynolds, P. W., “A High. Temperature Debye-Scherrer Camera and its Application to the Study of the Lattice Spacings of Silver,” Proc, Roy, Soc. (London), Ser. A 167: 25, 1938.Google Scholar
2. Owen, E. A., “A High Temperature X-Ray Analysis Camera,” J. Sci. Imtr. 20: 190, 1943.Google Scholar
3. Birks, L. S. and Friedman, H., “A High Temperature X-Ray Diffraction Apparatus,” Rev. Sci. Instr. 18: 576, 1947.Google Scholar
4. Valkenburg, A. V. and McMurdie, H. F., “High Temperature X-Ray Diffraction Apparatus,” Natl. Bur. Std. (U.S.), Rev. Papers 1782: 415, 1947.Google Scholar
5. Owen, E. A., “A High Temperature X-Ray Camera for Use with Plate Specimens,” J. Sci. Imtr. 26: 114, 1949.Google Scholar
6. Goldschmidt, H. J. and Cunningham, J., “A High Temperature X-Ray Diffraction Camera,” J. Sci. Instr. 27: 177, 1950.Google Scholar
7. Edwards, J. W., Speiser, R., and Johnston, H. L., “High Temperature Structure and Thermal Expansion of Some Metals as Determined by X-ray Diffraction Data,” J. Appl. Phys. 24: 424, 1951.Google Scholar
8. Mauer, F. A. and Bolz, L. H., “Thermal Expansion of Cermet Components by High Temperature X-Ray Diffraction,” Nail. Bur, Std. Report 3148, 1953.Google Scholar
9. Eitks, L. S., “Apparatus for X-Ray Diffraction Studies of Metals Under Controlled Stress at Elevated Temperature,” Rev. Sri. Instr. 25: 963, 1954.Google Scholar
10. Chiotti, P., “Adaptation of Geiger Counter X-Ray Diffractometer for High Temperature Investigations,” Rev. Sri. Instr. 25: 683, 1954.Google Scholar
11. Butters, R. G. and Parr, J. G., “A High Temperature X-Ray Goniometer,” Can. J. Technal. 33: 117, 1955.Google Scholar
12. Pease, R. S., “The Measurement of Specimen Temperature in a High Temperature X-Ray Powder Camera,” J. Sci. Instr. 32: 476, 1955.Google Scholar
13. Peiser, H. S., Rooksby, H. P., and Wilson, A. J. C., X-Ray Diffraction by Polycrystalline Materials, The Institute of Physics, London, 1955, p. 242.Google Scholar
14. Austin, A. E., Richafd, N. A., and Schwartz, C. M., “High Temperature X-Ray Diffraction Camera,” Rev. Sri. Instr. 27:860, 1956.Google Scholar
15. Brand, J. A. and Goldschmidt, H. J., “The Temperature Calibration of a High Temperature X-Ray Diffraction Camera,” J. Sci. Instr. 33: 41, 1956.Google Scholar
16. Johnson, J. R. and White, G. D., “Note on a High Temperature Attachment for an X-Ray Spectrometer,” I. Am. Cerom. Soc. 39: 227, 1956.Google Scholar
17. Williamson, G. K. and Moore, A., “A Precision High Temperature Specimen Chamber for an X-Ray Diffractometer,” J. Sci. Instr, 33 :107, 1956.Google Scholar
18. Goon, E. J., Mason, J. T., and Thomas, R. P., “X-Ray Powder Diffraction Assembly for Studies at Elevated Temperatures and High Gas Pressures,” Rev, Sci. Instr. 28:342, 1957.Google Scholar
19. Grim, R. E. and Kulbicki, G., “Study of High Temperature Reactions in the Clay Minerals by Means of X-Kays,” Congress of Ceramic Techniques, Patis, 1957.Google Scholar
20. Perri, J. A., Banks, E., and Post, B., “Study of Phase Transitions in WO3 with a High Temperature X-Ray Diffractometer,” J. Appl, Phys. 28: 1272, 1957.Google Scholar
21. Kennedy, S. W. and Calvert, L. D., “Oxidizing Atmosphere Furnace for Use with an X-Ray Diffractometer,” J. Sci. Instr, 35: 61, 1958.Google Scholar
22. Anija, E., Melch, J. H., and Gutt, W., “X-Ray Analysis Technique for Very High Temperatures,” J. Sci. Instr. 36: 16, 1959.Google Scholar
23. Spreadborough, J. and Christian, J. W., “High Temperature X-Ray Diffractometer,” J. Sci. Instr. 36: 116, 1959.Google Scholar
24. Baun, W. L., “Design and Application of a Variable Temperature Diffractometer Specimen Mount,” Advances in X-Ray Analysis, Vol. 4, William M. Mueller (éd.), University of Denver, Plenum Press, New York, p. 201211.Google Scholar
25. Corvin, I., Schossberger, F., and Ticulka, F., “Alignment Device and Thermal Control System for High Temperature X-Ray Diffractometry,” Advances in X-Ray Analysis, Vol. 5, William M. Mueller (éd.), University of Denver, Plenum Press, New York, 1962, p. 221228.Google Scholar
26. Mauer, F. A. and Bolz, L. H., “Problems in the Temperature Calibration of an X-Ray Diffractometer Furnace,” Advances in X-Ray Analysis, Vol. 5, W'illiam M. Mueller (éd.), University of Denver, Plenum Press, New York, 1962, pp. 229237.Google Scholar
27. Vaughan, D. A. and Schwartz, C. M., “Determination of Thermal Expansion by High Temperature X-Ray Diffraction,” Advances in X-Ray Analysis, Vol. 5, William M. Mueller (ed.), University of Denver, Plenum Press, New York, 1962, pp. 238243.Google Scholar