Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-05T04:18:11.513Z Has data issue: false hasContentIssue false

An Area-Imaging Proportional Counter for X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

C. Richard Desper
Affiliation:
Polymer Research Division, Organic Materials Laboratory, Army Materials & Mechanics Research Center, Watertown, Massachusetts 02172
Ronald Burns
Affiliation:
Xentronics Corporation, Cambridge, Massachusetts 02140
Get access

Extract

Slow data acquisition rates have, in the past, limited the use of X-ray diffraction for characterization of polymeric materials. Photon counting techniques yield quantitative data in digital form for computer analysis. However, a great deal of data acquisition time is required when data is taken sequentially; i.e., when each intensity determination (at a particular goniometer setting) requires a separate time interval, during which intensity at other angle values is ignored. The problem is particularly acute for oriented polymers since two or more diffraction angles are involved: The Bragg angle along with at least one orientation angle. For this reason, an area-imaging (two-dimensional) proportional counter has been developed for use with a four-circle X-ray diffraction system. Although basically a single-crystal unit, this goniometer has been used in this laboratory and others for studies of oriented polymers. The receiving pinhole collimator and aperture have been removed, and the area-imaging counter has been mounted on the detector arm track. The original receiving aperture is still used for alignment, and the area detector Is positioned with its center at the receiving aperture center position.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1980

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Desper, C. R., A computer-controlled X-ray diffractometer for texture studies of polycrystalline materials, in: “Advances in X-ray Analysis, Vol. 12,” Barrett, C. S., Mallet, G. R., and Newkirk, J. B., eds., Plenum, New York, 1969.Google Scholar
2. Borkowski, C. J. and Kopp, M. K., Design and properties of position-sensitive proportional counters using resistance-capacitance position encoding, Rev. Sci. Instrum. 46:951 (1975).Google Scholar
3. Desper, C. R., Southern, J. H., Ulrich, R. D., and Porter, R. S., Orientation and structure of polyethylene crystallized under the orientation and pressure effects of a pressure capillary viscometer, J. Appl. Phys, 41:4284 (1970).Google Scholar