Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-23T12:50:57.920Z Has data issue: false hasContentIssue false
  • English
  • Français

Advances in Fundamental-Parameter Methods for Quantitative XRFA

Published online by Cambridge University Press:  06 March 2019

Michael Mantler
Michael Mantler*
Affiliation:
Technical University Vienna A -1040 Vienna, Austria
Get access

Extract

The fundamental-parameter technique is an important tool for quantitative x-ray chemical analysis and is routinely applied for the quantification of bulk specimens and single layer films. A method extending it to multiple film layers has recently been introduced by Mantler and results from such applications have been reported by Huang and Parrish. In addition, fundamental-parameter methods can be employed to predict intensity ratios of fluorescent lines as well as the spectral distribution of radiation scattered by the specimen (shape of the background in the vicinity of emission, lines). This is useful for accurate quantitative analysis in the case of a poor peak-to-background ratio, where the precise determination of net intensities is difficult.

Type
III. XRF Fundamental Parameters and Data Analysis
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 97 - 104
Copyright
Copyright © International Centre for Diffraction Data 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Mantler, M., “Advances in X-Ray Analysas ”, vol. 26, 351 (1 985).Google Scholar
2. Mantler, M., Analytica Chimica Acta, in press (1986).Google Scholar
3. Huang, T.C., Parrish, B., “Advances in X-ray Analysis”, vol. 29, 395 1986).Google Scholar
4. Laguitton, D., Mantler, M., “Advances in X-Ray Analysis”, vol. 20, 515 (1977).Google Scholar
5. Mantler, M., “Advances in X-Eay Analysis”, vol. 27, 433 (1984).Google Scholar
6. Criss, J., “FTRIXIF. A Fortran Program for X-Ray Fluorescence Analysis”, URL. Washington, DC. 1977). Distrib.: COSMIC. Univ. of Georgia, Athens.Google Scholar
7. Criss, J. Software Inc., Largo, Md 20772.Google Scholar
8. Pollai, G., Ebel, H., Mantler, M., Spectrochim. Aeta, 26B. 761 (1971).Google Scholar
9. Gilfrich, J.V., Birks, L.S., Anal.Chem. 40, 1077 (1968).Google Scholar
10. Arai, T., Shoji, T., Onote, K., “Advances in X-Ray Analysis”, vol. 29, 413 (1986). (Reference pertains to side-Wrindow-tube spectra only).Google Scholar
11. Lonsdale, K. (ed.), “International Tables for X-Ray Crystallography”, vol. 3, The Kynoch Press, Birmingham (1968).Google Scholar
12. McMaster, W.H., Kerr Del Grande, N., Mallett, J.H., Hubbel, J.H., “Compilation of X-Ray Cross Sections”, Document UCRL. 0174, Hatl. Techn. Inf. Service O.S. Dept. of Comm., Springfield, Va 22161.Google Scholar