Most users of X-Ray Fluorescence analysis (XRF) are accustomed to thinking of it as a bulk analysis method, and certainty in many cases it does report the representative average composition of the sample. But whereas the trace analysis of lead in gasoline may extend to a depth of several cm., that for a light element in a moderately absorbing matrix may take place only within a few micrometers of the surface, placing severe demands on the specimen preparation method to produce a surface layer representative of the bulk material. XRF is rarely used specifically to analyze surfaces, except for some coating thickness measurements. Nevertheless, many of the same laboratories that rely heavily on XRF are called upon to perform surface analysis for various purposes, and therefore this invited survey paper witt seek to present an overview of some of the major techniques which are available.