Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-23T14:49:51.705Z Has data issue: false hasContentIssue false
  • English
  • Français

XRD Acquisition Parameters for Detection of Weak Peaks

Published online by Cambridge University Press:  06 March 2019

P. W. Seabaugh ,
D. B. Sullenger ,
C. R. Hudgens ,
M, C. Nichols  and
D. R. Boehme
P. W. Seabaugh
Affiliation:
EG&G Mound Applied Technologies Miamisburg, Ohio
D. B. Sullenger
Affiliation:
EG&G Mound Applied Technologies Miamisburg, Ohio
C. R. Hudgens
Affiliation:
EG&G Mound Applied Technologies Miamisburg, Ohio
M, C. Nichols
Affiliation:
Sandia National Laboratories Livermore, California
D. R. Boehme
Affiliation:
Sandia National Laboratories Livermore, California
Get access

Extract

The use of high-intensity, 8Kw, x-ray sources (Rigaku rotating-anode generator and wide - angle goniometer for this study) provides both opportunities and challenges. With high - intensity x-ray sources, detection limits can be lowered significantly while still offering count times of practical duration. On the other hand, the availability of high intensity x-ray sources puts greater demands on information extraction procedures and on the mechanical preciseness of sample containment and support. In particular we addressed the use of a cylindrical aluminum sample cell with a 0.010’’ polycrystalline (cold rolled) beryllium window electron –beam welded to an aluminum frame. See Figure 1. This cell permitted analysis of various air-sensitive specimens. The sample was pressed against the back of the beryllium window by a spring-loaded backing plate.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 313 - 318
Copyright
Copyright © International Centre for Diffraction Data 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Howard, S. A., SHADOW:. A. System for X-Ray-Diffraction Pattern Analysis (1988), Adv. in X-Ray Anal., 32; 523–530 (1989)Google Scholar
2. Howard, S. A., Snyder, R. L.. An Evaluation of Some Profile Models and the Optimisation Procedures Used in Profile Filling, Adv. in X-ray Anal., 26; 73–81 (1983).Google Scholar
3. Howard, S. A., Incorporating W*G Deconvolution in X-ray Rietveid Structure Refinement, Ph.D. Thesis. New York State College of Ceramics (1984).Google Scholar