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X-ray Study on Fatigue Fracture Surfaces of Aluminum Alloy Reinforced with Silicon Carbide Whiskers

Published online by Cambridge University Press:  06 March 2019

Katsuyuki Funaki
Affiliation:
Industrial Research Institute of Ishikawa Ro-1, Tomizumachi, Kanazawa 920-02, Japan
Yukio Nanayama
Affiliation:
Industrial Research Institute of Ishikawa Ro-1, Tomizumachi, Kanazawa 920-02, Japan
Yoshiji Ichimaru
Affiliation:
Industrial Research Institute of Ishikawa Ro-1, Tomizumachi, Kanazawa 920-02, Japan
Yukio Hirose
Affiliation:
Department of Material Science, Kanazawa University 1-1, Marunouchi, Kanazawa 920, Japan
Keisuke Tanaka
Affiliation:
Department of Engineering Science, Kyoto University Yoshida-honmachi, Sakyo-ku, Kyoto 606, Japan
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Extract

X-ray fractography is a new method which utilizes X-ray diffraction observation of the fracture surface for the analysis of micromechanisms and mechanics of fracture. The line broadening of X-ray diffraction profiles and the residual stress left on the surface are two of the important parameters.

Type
XII. Analysis of Stress and Fracture by Diffraction Methods
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

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