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X-Ray Study of Wire-Drawn Niobium and Tantalum

Published online by Cambridge University Press:  06 March 2019

R. P. I. Adler
Affiliation:
Martin Company, Orlando, Florida
H. M. Otte
Affiliation:
Martin Company, Orlando, Florida
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Abstract

Deformation, introduced into niobium and tantalum specimens by wire drawing at room temperature, produced changes in the shape and position of X-ray diffraction peaks. The resultant peak profiles and locations of all available peaks were recorded using the Debye-Scherrer geometry on a modified dtffractometer with crystal monochromated Cu Kα radiation. The amount of deformation in the surface layers of both metals was found to saturate essentially after only 20% reduction in area. The measured decrease in the lattice parameters of either material was attributed to a residual surface stress; the average value for the deformed saturated state for both tantalum and niobium wires corresponded to an equivalent longitudinal tensile stress of 35 ± 5 kg/mm2. Integral breadth measurements revealed approximately equal X-ray particle sizes in the <100> and <110> directions; the minimum particle size for the micro structures of both metals was around 200 Å and occurred after the first few draws.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1965

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