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X-Ray Stress Measurement by the Single-Exposure Technique

Published online by Cambridge University Press:  06 March 2019

John T. Norton*
Affiliation:
Massachusetts Institute of Technology Cambridge, Massachusetts Advanced Metals Research Corporation Burlington, Massachusetts
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Abstract

X-ray techniques employing film recording continue to play an important role in the routine determination of residual stresses in metals, particularly where heavy and bulky specimens are involved. The single-exposure technique in which the two diffraction patterns required are obtained simultaneously in a single X-ray exposure has several practical advantages over the more conventional two-exposure technique for many routine applications. Details of the method are discussed and an analysis is made of the factors influencing the reliability of the stress determination. An apparatus for stress measurement having some unique features is described and a practical application presented, illustrating the use of the single-exposure technique for the determination of the stress constant of a specimen of hardened steel. The specimen was subjected to a series of known stresses in bending, both in tension and compression. The measured diffraction-line displacements were plotted against the applied stress, and a line was fitted to the points by a least-squares calculation. From its slope, the stress constant was determined. The standard deviation of individual stress determinations from the “true” values given by the least-square line was calculated and was in excellent agreement with the value calculated from the errors of measurement. It is concluded that the single-exposure technique with its reduced time required for measurement and less demanding requirement of precise instrumental adjustment provides a reliable and practical method for many routine stress measurement applications.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1967

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References

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