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X-Ray Spectrographs Analysis of Traces in Metals by Preconcentration Techniques

Published online by Cambridge University Press:  06 March 2019

C. M. Davis ,
Keith E. Burke  and
M. M. Yanak
C. M. Davis
Affiliation:
The International Nickel Company, Inc. Paul D. Merica Research Laboratory Sterling Forest, Suffern, New York
Keith E. Burke
Affiliation:
The International Nickel Company, Inc. Paul D. Merica Research Laboratory Sterling Forest, Suffern, New York
M. M. Yanak
Affiliation:
The International Nickel Company, Inc. Paul D. Merica Research Laboratory Sterling Forest, Suffern, New York
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Abstract

Chemical separation techniques with their roots in classical analysis have been highly developed since the turn of the century. During the last two decades, X-ray spectrography has proven to be a very acceptable method of analysis because of the relative ease and rapidity of measurement of the intensity of characteristic wavelengths, the ready knowledge of the precision of the measurement, the facility of automating the analysis, and the nondestructive nature of the method. When chemical separation techniques are combined with X-ray spectrography, the problem of matrix effects is eliminated and the element being analyzed is substantially concentrated, which affords a means of performing trace element analyses. Published examples of preconcentration followed by X-ray measurement both outside and in the field of metallurgy are cited.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 11: Sixteenth Annual Conference on Applications of X-ray Analysis, August 9-11, 1967 , 1967 , pp. 56 - 62
Copyright
Copyright © International Centre for Diffraction Data 1967

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References

1. Davies, T. A., “Application of Solids Mass Spectroscopy to Metallurgical Analysis,” in: P. W. West, A. M. G. MacDonald and T. S. West (eds.), Analytical Chemistry, 1962, Elsevier Publishing Co., Amsterdam, 1963, p. 328.Google Scholar
2. Davis, C. M., “X-Ray Emission Spectrography in the Metal Industry,” Colloq. Spectroscopicum Intern. 8: 281, 1959.Google Scholar
3. Narbutt, K. I., “Present State of X-Ray Analysis,” Zavodsk. Lab. 24: 604, 1958.Google Scholar
4. Campbell, W. J., Brown, T. D., and Thatcher, J. W., “X-Ray Absorption and Emission,” Anal. Chem. 38, 416R, 1966.Google Scholar
5. Davis, C. M. and Yanak, M. M., “Performance of an Unattended Automated X-Ray Spectrograph,” in: W. M. Mueller, G. Mallett, and M. Fay (eds.), Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1964, p. 644.Google Scholar
6. Loomis, T. C., “X-Ray Spectroscopy as an Analytical Tool,” Ann. N.Y. Acad. Sci. 137: 284, 1966.Google Scholar
7. Birks, L. S., X-Ray Spectrochemical Analysis, Interscience Publishers, Inc., New York, 1966, p. 55.Google Scholar
8. Minns, R. E., “Reduction of Limits of Detection by Concentration—An Anion Exchange Technique,” in: Limitations of Detection in Spectrochemical Analysis, Hilger & Watts, Ltd., London, 1964, p. 45.Google Scholar
9. Luke, C. L., “Ubratrace Analysis of Metals with a Curved Crystal X-Ray Milliprobe,” Anal. Chem. 36: 318, 1964.Google Scholar
10. Chamberlain, B. R. and Leech, R. T., “Determination of Microgram Quantities of Tin(IV) by a Combined I on-Exchange/X-Ray Fluorescence Technique,” Talanta 14: 597, 1967.Google Scholar
11. Hubbard, G. L. and Green, T. E., “Dithizone Extraction and X-Ray Spectrographic Determination of Trace Metals in High-Purity Tungsten or Tungsten Trioxide,” Anal. Client. 38: 428, 1966.Google Scholar
12.“Symposium on Solvent Extraction in the Analysis of Metals,” ASTM Spec. Tech. Publ. No. 238, 1958.Google Scholar
13. Morrison, G. H. and Freiser, H., Solvent Extraction in Analytical Chemistry, John Wiley & Sons, Inc., New York, 1957.Google Scholar
14. Freiser, H., “Extraction,” Anal. Chem. 38: 131R, 1966.Google Scholar
15. Luke, C. L., “Trace Analysis of Metals by Borax Disk X-Ray Spectrometry,” Anal. Chem. 35: 1551, 1963.Google Scholar
16. Stone, R. G., “The Determination of Strontium in Tap-Water by X-Ray Fluorescence Spectrometry,” Analyst 88: 56, 1963.Google Scholar
17. Lytel, F. W., Dye, W. B., and Seim, H. J., “Determination of Trace Elements in Plant Material by Fluorescent X-Ray Analysis,” in: W. M. Mueller (ed,), Advances in X-Ray Analysis, Vol. 5, Plenum Press, New York, 1962, p. 433.Google Scholar
18. Mathies, J. C., Lund, P. K., and Eide, W., “A Simple, Indirect Sensitive Procedure for the Determination of Nitrogen (Ammonia) at the Microgram and Submicrogram Level,” Norelco Kept. 9: 93, 1962.Google Scholar
19. Luke, C. L., “Determination of Refractory Metals in Ferrous Alloys and High-Alloy Steel by the Borax Disk X-Ray Spectrochemical Method,” Anal. Chem. 35: 56, 1963.Google Scholar
20. Rudolph, J. S. and Nadalin, R. J., “Determination of Microgram Quantities of Chloride in High Purity Titanium by X-Ray Spectrochemical Analysis,” Anal. Chem. 36: 1815, 1964.Google Scholar
21. Garska, K. J., “Determination of Microgram Quantities of Inorganic Chlorides in Refractory Solids,” presented as paper No. 143 at the 18th Annual Mid-America Symposium on Spectroscopy, May 1967.Google Scholar
22. Rudolph, J. S., Kriege, O. H., and Nadalin, R. J., “Applications of Chemical Precipitation Methods for Improving Sensitivity in X-Ray Fluorescent Analysis,” in: E. N. Davis (ed,), Developments in Applied Spectroscopy, Vol. 4, Plenum Press, New York, 1965, p. 57.Google Scholar
23. Burke, K. E., Yanak, M. M., and Albright, C. G., “Determination of Parts per Million Quantities of Tellurium in Various Alloys by X-Ray Spectrometry,” Anal. Chem. 39: 14, 1967.Google Scholar
24. Albright, C. H., Burke, K. E., and Yanak, M. M., “A Chemical Concentration X-Ray Determination of Selenium in Nickel- and Iron-Base Alloys,” presented as paper No. 142 at the 18th Annual Mid-America Symposium on Spectroscopy, May 1967.Google Scholar