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X-Ray Projection Microradiography and Divergent Beam Techniques

Published online by Cambridge University Press:  06 March 2019

F. W. Von Batchelder
F. W. Von Batchelder*
Affiliation:
U. S. Naval Research Laboratory, Washington, D. C.
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Abstract

The topics to be covered are X-ray projection imcroradiography, which embodies the examination of thin poly crystalline sections with the aid of a microfocus X-ray unit, and similar divergent beam examination of thin single crystals.

In X-ray projection or shadow microradiography we restrict our interest to the field of metallurgy and typical examples will be illustrated from ferrous and nonferrous alloys. No special techniques are necessary in the making of these microradiographs, which are recorded on industrial fine grain X-ray film, and which are processed and viewed like regular radiographs. A Hilger microfocus unit operated at 45 kv, 250μa, using a Cu target, 40 micron focal spot was employed.

Some preliminary results will be illustrated from our application of the divergent beam technique.to single crystals.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 2: Seventh Annual Conference on Industrial Applications of X-ray Analysis, August 13-15, 1958 , 1958 , pp. 283 - 291
Copyright
Copyright © International Centre for Diffraction Data 1958

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