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X-Ray Probe with Collimation of the Secondary Beam
Published online by Cambridge University Press: 06 March 2019
Abstract
An attachment to a commercial flat-crystal X-ray fluorescent goniometer permits analysis of small areas. The selection of the sample area is achieved by collimating the secondary beam. The geometry of the probe, its stage, and counting statistics applied to the probe are discussed. Experimental data are shown referring to determination of spot size, counting rates obtained, and both qualitative and quantitative applications.
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- Research Article
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- Copyright © International Centre for Diffraction Data 1961
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