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X-Ray Fluorescence Determination of Trace Elements in Complicated Matrices

Published online by Cambridge University Press:  06 March 2019

Liu Yawen ,
Fan Qinmin  and
Li Daolun
Liu Yawen
Affiliation:
Institute of High Energy Physics, Academia Sinica Beijing, The People's Republic of China
Fan Qinmin
Affiliation:
Institute of High Energy Physics, Academia Sinica Beijing, The People's Republic of China
Li Daolun
Affiliation:
Institute of High Energy Physics, Academia Sinica Beijing, The People's Republic of China
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Abstract

A method for the direct determination of trace elements in light element matrices is described. The intensity of Compton scatter of the incident X-rays from the specimen was used to evaluate the apparent absorption factor for the direct correction for matrix effects. This permits the use of single element standards for samples of varied and complicated matrix composition. Relative errors of approximately 5% were obtained for results in the concentration range of 10-200 ppm.

Type
V. XRF Applications; Fuels and Lubricants, Metals and Alloys, Geological, Heavy Element, Other
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 309 - 314
Copyright
Copyright © International Centre for Diffraction Data 1986

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