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X-Ray Fluorescence Analysis of Refractory Oxide Materials

Published online by Cambridge University Press:  06 March 2019

Subrata Banerjee  and
Ben G. Olsen
Subrata Banerjee
Affiliation:
General Refractories Company Research Center Baltimore, Maryland 21203
Ben G. Olsen
Affiliation:
General Refractories Company Research Center Baltimore, Maryland 21203
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Abstract

In a refractory manufacturing industry with widely diversified products from silica (SiO2 ≥ 90%) to high alumina materials (Al2O3 ≥ 90%) and basic refractory from periclase (MgO ≥ 95%) to chrome-periclase (Cr2O3 ≤ 40%) mixtures, introduction of a single method of analysis is impractical both economically and precision-wise. Three different methods are proposed with a view to realistic needs: (a) Direct ratio method, (b) calibration curve ratio method, and (c) matrix normalization by fusing with Li2B4O7 and La2O3 into a glass bead followed by grinding and pelletizing. Statistical regression equations were used for the calibration curves from available NBS standards 15-20 samples previously analysed by wet chemical methods by ratioing with relevant reference samples. In most cases, the relative standard deviation was 2 - 8%.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 317 - 326
Copyright
Copyright © International Centre for Diffraction Data 1974

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