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X-Ray Fluorescence Analysis of Nonhomogeneous Materials by Δμ-Correction Method

Published online by Cambridge University Press:  06 March 2019

V. I. Karmanov  and
V. V. Zagorodny
V. I. Karmanov
Affiliation:
E.O. Paton Electric Welding Institute of the Ukraine Academy of Sciences, Kiev, Ukraine
V. V. Zagorodny
Affiliation:
E.O. Paton Electric Welding Institute of the Ukraine Academy of Sciences, Kiev, Ukraine
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Abstract

The fundamental parameters method (FPM) enables one to determine with high accuracy the chemical composition of homogeneous samples, having only one reference sample. However, the reference sample composition should be similar to that of the samples analyzed.

The x-ray fluorescence analysis of multicomponent heterogeneous materials (ores, minerals, their mixtures, welding electrode coating mixtures, fluxes, etc.) is made by the Δμ-correction method based on the combined use of the fundamental and empirical correlations maintaining all the advantages of the FPM. Sample composition is calculated on the basis of the element intensities measured in the sample and in the reference specimen and is corrected for the disturbing effect of excitation conditions and heterogeneity as well as the calculated values of one of the fundamental parameters (μ1). At the preliminary stage of calibration, the coefficients are determined using regression and the absolute fundamental expression for the element fluorescence intensity.

Type
X. Mathematical Methods in X-Ray Spectrometry (XRS)
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 749 - 754
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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