Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T04:49:59.016Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Diffraction Orientation Studies Using Two-Dimensional Detectors

Published online by Cambridge University Press:  06 March 2019

T.N. Blanton
T.N. Blanton*
Affiliation:
Analytical Technology Division Kodak Park B49 Eastman Kodak Company Rochester, NY 14652-3712
Get access

Extract

Two-dimensional detectors utilized in x-ray diffraction studies are described. Film, image intensifier/CCD camera, two-dimensional position-sensitive area, and photostimulable storage phosphor detectors are compared. The storage phosphor detector was found to be well suited for analysis of oriented semicrystalline polyester films. Quantitation of polymer orientation was determined using the Hermans orientation distribution function.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 367 - 373
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Miyahara, J., Takahashi, K., Amemiya, Y., Kamiya, N., and Satow, Y., “A New Type of X-ray Area Detector Utilizing Laser Stimulated Luminescence,” Nucl. Instrum. Meth. A246: 572, (1986)Google Scholar
2. Callcott, T.A., Tsang, K.L., Zhang, C.H., Ederer, D.L., and Arakawa, E.T., “Area Detectors for X-ray Spectroscopy,” Nucl. instrum. Meth. A266: 578, (1988).Google Scholar
3. Whiting, B.R., Owen, J.F., and Rubin, B.H., “Storage Phosphor X-ray Diffraction Detectors,” Nucl. Instrum. Meth. A266: 628, (1988).Google Scholar
4. Tucker, P.A., “Materials Science Forum Volumes 79-82 EPDIC 1,” Delhez, R. and Millemeijer, E.J., ed., Trans Tech Publications, Switzerland, 349 (1991).Google Scholar
5. Elf, F., Will, G., and Weisgerber, S., “Materials Science Forum Volumes 79-82 EPDIC 1,” R. Delhez and Mittemeijer, E.J., ed. Trans Tech Publications, Switzerland, 371 (1991).Google Scholar
6. Chung, D. D. L., DeHaven, P.W., Arnold, H., and Ghosh, D., “X-ray Diffraction at Elevated Temperatures,“ VCH Publishers, Inc., New York, New York (1993).Google Scholar
7. Amemiya, Y., Kishimoto, S., Matsushita, T., and Satow, Y., “Imaging Plate for Time-Resolved X-ray Measurements,” Rev. Sci. Instrum. 60(7):1552(1989).Google Scholar
8. Yoshioka, Y., Shinkai, T., and Ohya, S., “Advances in X-ray Analysis Volume 33,” Barrett, C.S., ed., Plenum Press, New York, New York, 389 (1990).Google Scholar
9. K., Sasaki, Yamazaki, H., Masuda, K., and Hsiue, G.H., presented at 42nd Annual Denver Conference on Applications of X-ray Analysis, Denver, Colorado (1993).Google Scholar
10. Baumgartner, B., presented at 42nd Annual Denver Conference on Applications of X-ray Analysis, Denver, Colorado (1993).Google Scholar
11. Alexander, L.E., “X-ray Diffraction Methods in Polymer Science,” Wiley-Interseience, New York, New York (1969).Google Scholar