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X-Ray Diffraction Investigation of Vacuum-Deposited Metallic Films
Published online by Cambridge University Press: 06 March 2019
Abstract
In the course of work on the vacuum deposition of metallic films, a series of X-ray diffraction investigations was run on the effects of base material orientation, heat treatment, and angle of deposition, on the structure of the deposed films. Results show that the film structure can be altered by changing several parameters during and after the deposition process. An attempt is made to correlate this structure with film adhesion and protective characteristics.
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- Copyright © International Centre for Diffraction Data 1960