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A Versatile X-Ray Stress Analyzer Using a Position Sensitive Detector

Published online by Cambridge University Press:  06 March 2019

Yasuo Yoshioka ,
Ken-ichi Hasegawa  and
Koh-ichi Mochiki
Yasuo Yoshioka
Affiliation:
Musashi Institute of Technology, 1 Tamazutsumi, Setagaya, Tokyo 158, Japan
Ken-ichi Hasegawa
Affiliation:
Faculty of Engineering, University of Tokyo, 7 Hongoh, Bunkyo, Tokyo 113, Japan
Koh-ichi Mochiki
Affiliation:
Faculty of Engineering, University of Tokyo, 7 Hongoh, Bunkyo, Tokyo 113, Japan
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Extract

Instrumentation for X-ray stress analysis has been advanced rapidly in the last few years. Especially, the time required for data accumulation has been remarkably reduced without motion of the detector by using a new X-ray detector called a position sensitive detector (PSD). Applications of PSD to the field of X-ray stress analysis were carried out by James and Cohen, Ruud and Barrett, and the authors. In our laboratory, several position sensitive proportional counters (PSPCs) were designed and manufactured for residual stress measurements. Results show that the PSPC method is a powerful alternative to the conventional counter method or the film method.

This paper reports a design of a versatile PSPC X-ray stress analyzer for use in industry and the laboratory.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 149 - 153
Copyright
Copyright © International Centre for Diffraction Data 1980

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References

1. James, M. R. and Cohen, J. B., “The Application of a Position Sensitive Detector to the Measurement of Residual Stresses,” Advances in X-Ray Analysis, 19:695 (1975).Google Scholar
2. Ruuc, C. O. and Barrett, C. S., “Use of Cr K-Beta X-Rays and Position Sensitive Detector for Residual Stress Measurement in Stainless Steel Pipe,” Advances in X-Ray Analysis, 22:247 (1979).Google Scholar
3. Yoshioka, Y., Hasegawa, K. and Mochikl, K., “Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter,” Advances in X-Ray Analysis, 22:233 (1979).Google Scholar
4. Yoshioka, Y., Hasegawa, K. and Mochiki, K., “A Position-Sensitive Proportional Counter for Residual Stress Measurement by Means of Microbeam X-Rays,” Advances in X-Ray Analysis, 23:325 (1980).Google Scholar