Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-27T03:46:48.476Z Has data issue: false hasContentIssue false
  • English
  • Français

A Versatile Vacuum Scanning Double Crystal Spectrometer for Soft X-Ray Absorption Edge Studies

Published online by Cambridge University Press:  06 March 2019

A.S. Bhalla  and
E.W. White
A.S. Bhalla
Affiliation:
Pennsylvania State University
E.W. White
Affiliation:
University Park, Pennsylvania 16802
Get access

Abstract

Studies of the fine structure of absorption edges in the soft x-ray region are becoming increasingly important as a tool for materials characterization. Examples of application includes determination of chemical state of elements, bonding and band structure studies. Intensity and resolving power of the x-ray spectrometer are important experimental considerations. As a rule adjustment of instrumental parameters, such as collimation, to give increased intensity adversely affect resolving power. Optimization of intensity and resolving power must therefore he achieved.

A newly designed double crystal spectrometer has been constructed for high-resolution absorption edge studies in the wavelength region of 5Ǻ to 70Ǻ.

The entire system is enclosed in a vacuum chamber ion pumped to the 10-7 torr range. The second crystal motion is obtained by means of an ULTRADEX 360-sided polygon and sine arm that is automatically step-scanned. The spectrometer functions equally well in the (l, + l) and (l, - l) orientation and as a precise single crystal spectrometer.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 13: Eighteenth Annual Conference on Applications of X-ray Analysis, August 6-8, 1969 , 1969 , pp. 272 - 288
Copyright
Copyright © International Centre for Diffraction Data 1969

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Compton, A. H. and Allison, S. K., “X-rays in Theory and Experiments” p. 709–750, D. Van Nostrand Company, Inc. N.Y. (1935).Google Scholar
2. Allison, S. K. and Williams, J. H., “The Resolving Power of Calcite X-rays and Natural Width of the Molybdenum Kα doublet.” Phys. Rev. 35, 1476 (1930).Google Scholar
3. Parratt, L. G., “Design of Double Crystal Spectrometer.” Phys. Rev. 41, 553 (1932).Google Scholar
4. Bearden, J. A., Henins, A., Marzolf, J. G., Sander, W. C. and Thomsen, S., “Precision Redetermination of Standard Reference Wavelengths for X-ray Spectroscopy,” Phys. Rev. 135, A899–910 (1964).Google Scholar
5. Deslattes, R. D., “Single Axis, Two Crystal X-ray Instrument,” Rev. Sci. Inst. 38(6), 815-20 (1967).Google Scholar
6. Brogen, G., “The Width of X-ray Emission Lines,” Arkiv. Fysik. 3, 507 (1952).Google Scholar
7. Schnopper, H. W., “The Argon K-absorption Edge-Two Crystal X-ray Spectrometry,” Thesis dissertation, Cornell University (1962).Google Scholar
8. Azaroff, L. V., “Plane-Polarized, Two Crystal X-ray Spectrometer,” Advances in X-ray Analysis, Vol. 9, 251–258 (1965).Google Scholar
9. Jaegle, P., “Diffraction of Soft X-rays Produced by Two Gratings,” (in French) Compt, Rend (French Academy) 245, 1412-15 (1957).Google Scholar
10. Jaegle, P., “Calculation of the Resolving Power of a Spectrograph with Two Concave Gratings at Glancing Incidence,” (French Academy) 250, 3620-3621 (1960).Google Scholar
11. Sawada, M. and Tsutsirmi, K., “Source Scanning Type X-ray Grating Spectrometer,” Jap. J. Appl. Phys. 40(4), 1950 (1969).Google Scholar
12. Gohshi, Y., “Simple Two Crystal Spectrometer and its Application to X-ray Spectrochemical Analysis,” Advances in X-ray Analysis, Vol. 12, Plenum Press, N.Y, (1968).Google Scholar
13. Annotated Bibliography on Soft-X-Ray Spectroscopy, NBS Monograph 52.Google Scholar
14. Herman, A., et al, “X-ray Absorption and Emission,” Analytical Chem. 34 (5), 282R-294R (1962).Google Scholar
15. Dowdey, J. E., “Fine Structure of the X-ray Absorption Edge of Cubic Ferrites,” Univ. Microfilms MIC-59-154, 99 PP (1959).Google Scholar
16. Porteus, J. O., “K Absorption Spectra of Alkali Metal Chlorides,” Univ. Microfilms MIC-59-135, 155 PP (1959).Google Scholar
17. Soules, J. A. and Shaw, C. H., “X-ray K Absorption Spectra of Solid Argon and Kripton,” Phys. Rev. 113., 470-72 (1959).Google Scholar
18. Liefield, R. J., “L Series X-ray Emission and Absorption Spectra in Zirconium,” Univ. Microfilms LC card # MIC 60-1197, 99 PP (1960).Google Scholar
19. Singh, J. N., “Fine Structure of the K X-ray Absorption Edge in Germanium,” Microfilms MIC 60-5350, 92 pp (1961).Google Scholar
20. Azaroff, L. W. and Das, B. N., “X-ray K Absorption Spectra of Cu-Ni Alloy,” Phys. Rev. 134, A747–A751 (1964).Google Scholar
21. Glaser, H., “The Absolute Absorption Co-efficient of Germanium and the Fine Structure in the K-edge of Some of its Compounds,” Phys. Rev. 82 (5), 616–620 (1951).Google Scholar
22. Bearden, J. A., “Precision X-ray Spectroscopy,” International Conference on Physics of X-ray Spectra (Cornell University) June 1968.Google Scholar
23. Birks, L. S., Hurley, J. W. and Sweeney, W. C., “Perfection of Rubylaser Crystals,” J. App, Phys. 36 (11) 3562-65 (1965).Google Scholar
24. Bond, W. L., “Precision Lattice Constant Determination,” Acta. Cryst. 13 (10), 814–818 (1960).Google Scholar
25. Hach, J. T. and White, E. W., “Study of Extended X-ray Absorption Fine Structure with the Use of Thick Targets,” Advances in. X-rays, Vol. 11, Plenum Press, New York, 1967, pp 339–344.Google Scholar
26. Mariano, A. N. and Wolff, G. A., “Polarity Identification of Some AB Compounds of Tetrahedral Coordination,” Zeit. Krist. 126, 244–261 (1968).Google Scholar