Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-23T11:43:50.992Z Has data issue: false hasContentIssue false
  • English
  • Français

Use of a Position Sensitive Detector

Macrostress automatic measurements, Quantitative phase analysis, Microstress analysis

Published online by Cambridge University Press:  06 March 2019

J. L. Lebrun ,
J. M. Sprauel  and
G. Maeder
J. L. Lebrun
Affiliation:
Dept. Materiaux, E.N.S.A.M., 151, Bd de l'Hôpital, 75640 PARIS Cedex 13, FRANCE
J. M. Sprauel
Affiliation:
Dept. Materiaux, E.N.S.A.M., 151, Bd de l'Hôpital, 75640 PARIS Cedex 13, FRANCE
G. Maeder
Affiliation:
Dept. Materiaux, E.N.S.A.M., 151, Bd de l'Hôpital, 75640 PARIS Cedex 13, FRANCE
Get access

Extract

Our goniometer used is a classical one with step scanning motors both on θ and 2θ movements. The theoretical radius is 250 mm but it can be changed easily.

Two kinds of PSD have been used, the older one of a resistive type with a carbon coated quartz fiber and, for this year, a capacitive one with a gold-plated molybdenum wire anode, which is more reliable, with a very good pulse height analyser. It is connected to a 48K calculator (IN 90) with a floppy disk unit. A special interface has been made which is able to drive separately the 2θ and θ movements of the goniometer, using the output signals of the calculator. After the different settings of the goniometer and the initialization of the positions in 9 and 26, every movement can be ordered either by a very simple software from the keyboard or inside a more complex program.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 143 - 148
Copyright
Copyright © International Centre for Diffraction Data 1980

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Castex, L., Lebrun, J.L., and Bras, S., “A New Model of X Ray Position Sensitive Detector Developed in France”, this conference.Google Scholar
2. “Quantitativen Rontgenographischen Phasenanalyse”, Harterei- Techn. 27: 229-278, (1972)Google Scholar
3. Houska, C.R., and Rao, V., “Determination of Volume Fraction in Multiphase Systems Using Incomplete Pole Figures”, Met. Trans., 9A: 1483, (1978)Google Scholar
4. Giamei, A.F., and Freise, E.J., “Optimization of X Ray Diffraction Quantitative Analysis”, Trans. TMS-AIME, 239: 1676 (1967)Google Scholar
5. Masson, S., “Application . de la methode de Warren-Averbach a l'etude de 1'Scrouissage superficiel par usinage d'un acier austenitique”, Mem. Scie et Tech. de l'Armement, 46: 1015, (1972)Google Scholar
6. Lebrun, J.L., Maeder, G., and Parniere, P., “Influence of the Cold Rolling Reduction on the stored-Energy in a Low Carbon Steel Sheet”, 5th I.C.O.T.O.M., Aachen, Ed. by Gottstein, G. and Lucke, K., Springer-Verlag, 513, (1978)Google Scholar
7. Gangulee, A., “Separation of the Particle Size and Microstrain Components in the Fourier Coefficients of a Single Diffraction Profile”, J. Appl.Cryst. 7: 434, (1974)Google Scholar
8. Mignot, J. and Rondot, D., “Methode de Separation des Dimensions de Domaine et des. Microdeformationsa. partir des coefficients de Fourier d'un seul Profil de Raie de Diffraction X”, Act.Met., 23: 1321, (1975)Google Scholar
9. Goto, T., “Application of X Ray Stress Measurement to Pre-Service inspection and In-Service inspection”, I.C.M, 2, Boston, 1614, (1976).Google Scholar