Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-25T02:24:02.550Z Has data issue: false hasContentIssue false
  • English
  • Français

Upgrading Sulfide Mineral Patterns for the ICDD Powder Diffraction File

Published online by Cambridge University Press:  06 March 2019

G. J. McCarthy ,
D. G. Grier  and
P. Bayliss
G. J. McCarthy
Affiliation:
Department of Chemistry North Dakota State University Fargo, ND 58105 USA
D. G. Grier
Affiliation:
Department of Chemistry North Dakota State University Fargo, ND 58105 USA
P. Bayliss
Affiliation:
Australian Museum Sydney, NSW 2000 Australia
Get access

Abstract

The majority of sulfide mineral patterns in the International Centre for Diffraction Data Mineral Powder Diffraction File have historically been of low quality (e.g., FN < 10 and qualitative intensities). A five-year study has resulted in upgrading approximately 20% of the poorer quality patterns and will triple the number of “star quality” patterns. This paper describes the experimental methods used to obtain these upgraded patterns. The essential role of diffraction pattern calculations and diffractogram simulations is stressed.

Type
II. Phase Analysis, Accuracy and Standards in Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 107 - 115
Copyright
Copyright © International Centre for Diffraction Data 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Smith, G.S. and Snyder, R.L., J. Appl. Crystalhgr., 23:60–65 (1979).Google Scholar
2. McCarthy, G.J., Holzer, J.M., Syvinski, W.M., Martin, K.J. and Garvey, R.G., in Adv. X-Ray Anal, Vol. 34, Plenum Publ. Co., New York, pp. 369–376 (1991).Google Scholar
3. McCarthy, G.J., Martin, KJ., Holzer, J.M., Grier, D.G., Syvinski, W.M., and Nodland, D.W., in Adv. X-Ray Anal, Vol. 35, Plenum Publ. Co., New York, pp. 17–23 (1992).Google Scholar
4. McCarthy, G.J., Pow. Diff., 1[2]: 89 (1986); McCarthy, G.J., Pow. Diff., 3:39-40 (1988).Google Scholar
5. McCarthy, G.J. and Welton, J.M., Pow. Diff., 4: 156–159 (1989).Google Scholar
6. Standard Reference Materials Silicon SRM-640b, Mica SRM-675 and LaB6 SRM-660 can be obtained from the National Institute of Standards and Technology, Office of Standard Reference Materials, Gaithersburg, MD, USA.Google Scholar
7. McMurdie, H.F., Morris, M.C., Evans, E.H., Paretzkin, B., and Wong-Ng, W., Pow. Diff., 1[1]:40–43 (1986).Google Scholar
8. Garvey, R.G., Pow. Diff., 1 [1]: 114 (1986).Google Scholar
9. Appleman, D.E. and Evans, H.T., U.S. Geological Survey Report PB 216188, U.S. Dept. of Commerce, Nat. Tech. Info. Serv. 5285. Port Royal Rd., Springfield VA 22151, USAGoogle Scholar
10. Blanchard, F.N., in Adv. X-Ray Anal, Vol. 26, Plenum Publ. Co., New York, pp. 225–233 (1983).Google Scholar
11. Smith, D.K., Nichols, M.C. and Holomany, M.A., Report SAND81-8226, Sandia National Laboratory, Albuquerque, New Mexico, U.S.A. (1981); Materials Data Inc., Livermore, CA, U.S.A., MICRO-POWD, Vers. 2-2.3, by K.L. Smith and D.K. Smith (1989-1993).Google Scholar
12. Wyckoff, R.W.G., Crystal Structures, Vol. 1-4, reprinted by R.E. Kreiger Publ Co. (1981-1986); Villars, P. and L.D. Calvert, Pearson's Handbook of Crystallographic Data for Intermetallic Phases, Vol. 1-3, Am. Soc. Metals, Metals Park, Ohio (1985).Google Scholar
13. Shannon, R.D., Acta Crystalhgr., A32:751–767 (1976).Google Scholar
14. Garvey, R.G., PDFEAPC. MS-DOS implementation of NBS*AIDS83, JCPDS-International Centre for Diffraction Data, Newtown Square, PA, USA (1988). See also C.R. Hubbard, J.K. Stalick, and A.D. Mighell, in Adv. X-Ray Anal, Vol. 24, Plenum Publ. Co., New York, pp. 99-109 (1981).Google Scholar