Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-23T15:50:49.085Z Has data issue: false hasContentIssue false
  • English
  • Français

Time-Resolved Observations of Solid Reactions and Structure Transitions using a PSD, An SSD and Computer Aided Measurement and Control

Published online by Cambridge University Press:  06 March 2019

Takamitsu Yamanaka ,
Shinji Kawasaki  and
Tsuyoshi Shibata
Takamitsu Yamanaka
Affiliation:
College of General Education, Osaka University 1-1 Machikaneyama Toyonaka, Osaka 660, Japan
Shinji Kawasaki
Affiliation:
College of General Education, Osaka University 1-1 Machikaneyama Toyonaka, Osaka 660, Japan
Tsuyoshi Shibata
Affiliation:
College of General Education, Osaka University 1-1 Machikaneyama Toyonaka, Osaka 660, Japan
Get access

Abstract

For time-resolved diffraction studies under high temperature and/or high pressure, we designed a new diffractometer incorporating a curved position sensitive detector and tested the rapid intensity measurement and the resolution of the angular dispersive diffraction. The diffraction profiles were compared with those from energy dispersive diffraction. Rapid intensity collection has been carried out with a CAMAC module. A curved position sensitive detector with a 120° working angular region was installed on the off-centered four circle diffractometer. Only a few seconds were needed to obtain a whole powder diffraction because of the extremely high counting efficiency due to the streamer mode.

Time-resolved observations of the dehydration reactions of Mg(OH)2 and Ca(OH)2, have been undertaken by angular dispersive and energy dispersive x-ray powder diffraction at high temperature. The in situ observations of the dehydration process provide kinetic information, such as the reaction rate, the apparent activation energy and the dehydration mechanism.

Type
VI. XRD Instrumentation, Techniques and Reference Materials
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 415 - 423
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Byram, S.K., Han, B., Rothbard, R.B., Samdahland, R.N. and Sparks, R., 1977, Adv. in X-Ray Analysis, 20, 529.Google Scholar
2. Duijn, J.H., C. W. E. van Eijk, Hollander, R.W. and Marx, R., 1986, Trans. IEEE Nucl. Sci., NS-33, 388.Google Scholar
3. Izumi, T., 1980, Nucl. Instrum. Methods, 177, 405.Google Scholar
4. Ballon, J., Comparat, V. and Pouxe, J., 1983, Nucl. Instrum. Methods, 217, 213.Google Scholar
5. Alekseev, G.D., Kalinina, N.A., Karpukhin, V.V., Khazins, D.M. and Krugrov, V.V., 1980, Nucl. Instrum. Methods, 177, 385.Google Scholar
6. Atac, M., Tollestrup, A. and Potter, D., 1982, Nucl. Instrum, Methods, 200, 345.Google Scholar
7. Hashizume, H., Iitaka, Y. and Ogawa, T., 1984, Nucl. Instrum. Methods, 225, 335.Google Scholar
8. Shishignchi, S., Minato, I. and Hashizume, H., 1986, J. Appl. Cryst. 19, 420.Google Scholar
9. Yamanaka, T., and Ogata, K., 1991, J. Appl. Cryst. 24, 111.Google Scholar