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Strain Measurements on Single Crystals and Macrograins with the Aid of an Automated Phi-Psi Goniometer

Published online by Cambridge University Press:  06 March 2019

B. Pathiraj ,
H. Koster ,
A. M. Nijssen ,
P. F. Willemse  and
B. H. Kolster
B. Pathiraj
Affiliation:
Materials Science Section Department of Mechanical Engineering Twente University of Technology P.O. Box 217 7500 AE Enschede, The Netherlands
H. Koster
Affiliation:
Materials Science Section Department of Mechanical Engineering Twente University of Technology P.O. Box 217 7500 AE Enschede, The Netherlands
A. M. Nijssen
Affiliation:
Materials Science Section Department of Mechanical Engineering Twente University of Technology P.O. Box 217 7500 AE Enschede, The Netherlands
P. F. Willemse
Affiliation:
Materials Science Section Department of Mechanical Engineering Twente University of Technology P.O. Box 217 7500 AE Enschede, The Netherlands
B. H. Kolster
Affiliation:
Materials Science Section Department of Mechanical Engineering Twente University of Technology P.O. Box 217 7500 AE Enschede, The Netherlands
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Abstract

A back reflection goniometer with possibilities of Φ and Ψ rotations of the specimen was developed for stress-strain analysis in single crystals and macrograins and was completely automated. A computer software in PASCAL language was developed. The system is capable of i) optimising the Φ, Ψ and 2θ positions for a reflection, ii) scanning all the specified reflections one after another, iii) determining the lattice spacings after applying suitable corrections to the intensity data and iv) correcting the lattice spacings for temperature variations. Experimental results of measurements on an aluminum single crystal in annealed and plastically deformed conditions are presented to indicate the speed, reproducibility and accuracy of measurements. Principal sources of errors and their control in the developed system are discussed.

Type
VIII. X-Ray Strain and Stress Determination
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 297 - 304
Copyright
Copyright © International Centre for Diffraction Data 1984

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