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Some Recent Developments in the Direct Viewing and High-Speed Recording of X-Ray Diffraction Patterns

Published online by Cambridge University Press:  06 March 2019

G.W. Goetze  and
A. Taylor
G.W. Goetze
Affiliation:
Westinghouse Research Laboratories
A. Taylor
Affiliation:
Westinghouse Research Laboratories
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Abstract

Experiments on the application of X-ray image intensifiers of the Fluorex type and of transmission-type secondary electron image intensifies (Astracon tubes) to the direct observation and recording of X-ray diffraction patterns have proved highly successful. Further improvements can be obtained by combining a Fluorex tube directly with an Astracon tube. By this means, the useful signal strength is so improved that movies at standard frame speed can be made which record the changing Laue pattern from a rotating crystal. It is shown how still further improvements are possible if the optical coupling in the system is improved by incorporating a fiber-optics window at the input of the Fluorex-Astracon tube. It is further indicated how a fiber-optics adapter can be used as an analog computer to convert the X-ray diffraction pattern from a single crystal into an exact representation of the reciprocal lattice which can be viewed directly.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 86 - 93
Copyright
Copyright © International Centre for Diffraction Data 1961

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References

1. Friedrich, W., Knipping, P., and Laue, M., Sitzber. Math.-Physik, Kl. bayer. Akad. Wise. München, Vol. 22, 1912, p. 303.Google Scholar
2. Taylor, A., Rev. Sci, Instr., Vol. 27, 1956, p. 757; X-Ray Metallography, John Wiley and Sons, New York, 1961.Google Scholar
3. Taylor, A., Unpublished work.Google Scholar
4. Coltman, J. W., Radiology, Vol. 51, 1948, p. 359.Google Scholar
5. Lang, A. R., Rev. Sci. Instr., 1954, p. 1032.Google Scholar
6. Bertin, E. P., Anal. Chem., Vol. 25, 1953, p. 708.Google Scholar
7. Custers, J. F. H., Am. Soc. Tool Engineers, Paper 104, Vol. 58, 1958.Google Scholar
8. Custers, J. F. H. and van der Wagt, A. J., Philips Tech. Rev., Vol. 21, 1959/60, p. 178.Google Scholar
9. Taylor, J. and Parrish, W., Rev. Sci. Instr., Vol. 26, 1955, p. 367.Google Scholar
10. Wachtel, M. M. et al., Rev. Sci. Instr., Vol. 31, No. 5, 1960, p. 576.Google Scholar
11.Mosaic Fabrications, Inc., Southbridge, Mass.: American Optical Co., Inc., Southhridge, Mass.; Bausch and Lomb, Inc., Rochester, New York.Google Scholar
12. Goetze, G. W. and Taylor, A., J. Appl. Phys. (in press).Google Scholar