Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T15:27:36.322Z Has data issue: false hasContentIssue false
  • English
  • Français

Semi-Quantitative XRD Analysis of Fly Ash Using Rutile as an Internal Standard

Published online by Cambridge University Press:  06 March 2019

A. Thedchanamoorthy  and
G.J. McCarthy
A. Thedchanamoorthy
Affiliation:
Department of Chemistry North Dakota State University Fargo, North Dakota 58105
G.J. McCarthy
Affiliation:
Department of Chemistry North Dakota State University Fargo, North Dakota 58105
Get access

Abstract

XRD analysis of fly ash was quantitated using the Reference Intensity Ratio (RIR) method and rutile (TiO2) as an internal standard. Rutile RIR's for 15 of the crystalline phases commonly observed in North American fly ash were determined. Error analysis on the various steps in quantitation indicated that precision ranged from ±10% of the amount present for phases that diffract x-rays strongly to ±21% for weakly diffracting phases. Limit of detection in the mostly glassy fly ashes ranged from 0.2% for lime, the most strongly diffracting phase, to 3.5% for weakly diffracting mullite. Accuracy evaluated with a simulated fly ash was within the limits established by precision, but in actual fly ash samples, accuracy will be a function of the match between the crystallinity and composition of the analyte and the analyte standard. Overlaps among peaks of some of the important phases require intensity proportioning; for this reason, the method is best described as semi-quantitative.

Type
IX. Qualitative and Quantitative Phase Analysis Diffraction Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 569 - 576
Copyright
Copyright © International Centre for Diffraction Data 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. McCarthy, G. J., Johansen, D.M., Steinwand, S.J., Thedchanamoorthy, A., Adv. X-Ray Anal. 31: 331–342 (1988).Google Scholar
2. McCarthy, G.J., Manz, O.E., Stevenson, R.J., Hassett, D.J. and Groenewold, G.H., in Fly Ash and Coal Conversion By-Products: Characterization. Utilization and Disposal II. Mat. Res. Soc. Symp. Proc. Vol. 65, Materials Research Society, Pittsburgh, pp. 165–166 (1986).Google Scholar
3. McCarthy, G. J., Manz, O.E., Johansen, D.M. Steinwand, S.J., Stevenson, R.J., and Hassett, D.J., in Fly Ash and Coal Conversion By-Products: Characterization. Utilization and Disposal III. Mat. Res, Soc. Symp, Proc. Vol. 86, Materials Research Society, Pittsburgh, pp. 109-112 (1987).Google Scholar
4. Klug, H.P. and Alexander, L.E., X-Ray Diffraction Procedures for Crystalline and Amorphous Materials. Wiley Interscience, New York (1974).Google Scholar
5. Chung, F.H., J. Appl. Crvst. 7: 519–526 (1974).Google Scholar
6. Davis, B.L., Reference Intensity Method of Quantitative X-ray Diffraction Analysis. 2nd Edition, South Dakota School of Mines, Rapid City (1988).Google Scholar
7. McCarthy, G. J. and Thedchanamoorthy, A., in Fly Ash and Coal Conversion ByProducts: Characterization, Utilization and Disposal V, Mat. Res. Soc. Symp. Proc. Vol. 136, Materials Research Society, Pittsburgh, in press.Google Scholar
8. McCarthy, G. J., Gehringer, R.C., Smith, D.K., Injaian, V.M. , Pfoertsch, D.E. and Kabel, R.L., Adv. X-Ray Anal. 24: 253–264 (1981).Google Scholar
9. Gehringer, R.C., McCarthy, G.J. and Garvey, R.G. , Adv. X-Ray Anal. 26:119–128 (1981).Google Scholar
10. Davis, B.L., Adv. X-Ray Anal. 31: 317–323 (1988).Google Scholar
11. Smith, D.K., Johnson, G.G. Jr. Scheible, A., Wims, A.M., Johnson, J.L. and Ulmann, G., Powder Diffraction. 2: 73–77 (1988).Google Scholar
12. Smith, D.K., Johnson, G.G. Jr. and Wims, A.M., Aust. J. Phys. 41: 311–321 (1988).Google Scholar
13. Rietveld, H.M.. J. Appl. Cryst. 2: 65 H969).Google Scholar
14. Hill, R. J. and Howard, C.J., J. Appl. Cryst. 20: 467–474 (1987).Google Scholar
15. Jordan, B. and Connor, B.H.O., in Proc. AXAA-88 Conf. , Perth, Australia, August 1988, pp. 309–318. Google Scholar
16. O, B.H.’Connor and Raven, M.D., Powder Diffraction. 3: 2–6 (1988).Google Scholar
17. Bish, D.L. and Chipera, J., Adv. X-Ray Anal. 31: 295–308 (1988).Google Scholar