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Sample Curvature Effects on d-versus-sin2ѱ plots for Residual Stress Analysis

Published online by Cambridge University Press:  06 March 2019

Allan Ward III ,
Heidi Allison ,
Brian Zimmerman  and
R. W. Hendricks
Allan Ward III
Affiliation:
Materials Science and Engineering Department Virginia Polytechnic Institute and State University Blacksburg, Virginia, USA 24061-0237
Heidi Allison
Affiliation:
Materials Science and Engineering Department Virginia Polytechnic Institute and State University Blacksburg, Virginia, USA 24061-0237
Brian Zimmerman
Affiliation:
Materials Science and Engineering Department Virginia Polytechnic Institute and State University Blacksburg, Virginia, USA 24061-0237
R. W. Hendricks
Affiliation:
Materials Science and Engineering Department Virginia Polytechnic Institute and State University Blacksburg, Virginia, USA 24061-0237
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Abstract

This paper corrects assumptions made by previous authors regarding the magnitude of the error in d-versus-sin2ѱ plots resulting from deviations of the sample surface from the focusing circle. The results show that the effect is not significant for ordinary residual stress measurements. This investigation has also shown that shapes in d-versus- sin2ѱ plots, similar to the sample curvature effect, may exist in samples with large residual stresses. Interpretation of the data should consider the magnitude of the apparent stress, which allows one to distinguish between apparent sample curvature effects and other causes.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 291 - 296
Copyright
Copyright © International Centre for Diffraction Data 1995

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References

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