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The Relevance of Proton Induced X-Ray Analysis to the Study of Separate Mineral Phases

Published online by Cambridge University Press:  06 March 2019

H.J. Annegarn ,
R.J. Keddy ,
C.C.P. Madiba ,
M.J. Renan  and
J.P.F. Sellschop
H.J. Annegarn
Affiliation:
Nuclear Physics Research Unit, University of the Witwatersrand, Johannesburg 2001, South Africa
R.J. Keddy
Affiliation:
Nuclear Physics Research Unit, University of the Witwatersrand, Johannesburg 2001, South Africa
C.C.P. Madiba
Affiliation:
Nuclear Physics Research Unit, University of the Witwatersrand, Johannesburg 2001, South Africa
M.J. Renan
Affiliation:
Nuclear Physics Research Unit, University of the Witwatersrand, Johannesburg 2001, South Africa
J.P.F. Sellschop
Affiliation:
Nuclear Physics Research Unit, University of the Witwatersrand, Johannesburg 2001, South Africa
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Extract

The sensitivity of proton induced X-ray analysis (PIXE) as a multi-element, non-destructive technique has been exhaustively reviewed recently. This follows the pioneering work of Johansson et al. in this field, in which sensitivities of 10-12g were announced. Between the dates of these two references (1970 and 1976 respectively), numerous papers have been published on the use of this technique and on the optimization of experimental conditions (choice of incident particle and energy in particular). The wide range of analytical applications reported at the Lund conference showed conclusively that PIXE has established itself as a viable and powerful analytical method.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 21: Twenty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-5, 1977 , 1977 , pp. 245 - 259
Copyright
Copyright © International Centre for Diffraction Data 1977

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