Hostname: page-component-7bb8b95d7b-s9k8s Total loading time: 0 Render date: 2024-09-29T02:22:36.903Z Has data issue: false hasContentIssue false
  • English
  • Français

Quasi-Fundamental Correction Methods Using Broadband X-Ray Excitation

Published online by Cambridge University Press:  06 March 2019

A. P. Quinn
A. P. Quinn*
Affiliation:
Corning Glass Works Corning, New York 14830
Get access

Abstract

A critical discussion of the equivalent wavelength representation of polychromatic primary radiation as applied to the fundamental parameters method is given. This representation raises problems with appropriate selection of equivalent wavelengths and with accurate calculation of secondary fluorescence. Methods for reducing these difficulties are discussed and have been incorporated into a mini-computer program which achieves reasonable accuracy for alloy test cases.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 22: Twenty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-4, 1978 , 1978 , pp. 293 - 302
Copyright
Copyright © International Centre for Diffraction Data 1978

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Shiraiwa, T. and Fujino, N., “Theoretical Calculation of Fluorescent X-Ray Intensities in Fluorescent X-Ray Spectrochemical Analysis,” Jap. J. Appl. Phys. 5, 886 (1966).Google Scholar
2. Criss, J. W. and Birks, L. S., “Calculation Methods for Fluorescent X-Ray Spectrometry, Empirical Coefficients vs. Fundamental Parameters,” Anal. Chem. 40, 1080 (1968).Google Scholar
3. Stephenson, D. A., “Theoretical Analysis of Quantitative X-Ray Emission Data: Glasses, Rocks, and Metals,” Anal. Chem. 43, 1761 (1971).Google Scholar
4. Shen, R. B. and Russ, J. C., “A Simplified Fundamental Parameters Method for Quantitative Energy-dispersive X-Ray Analysis,” X-Ray Spectrom. 6, 56 (1977).Google Scholar
5. Ciccarelli, M. F., “QUAN - A Computer Program for Quantitative X-Ray Fluorescence Analysis,” Anal. Chem. 49, 345 (1977).Google Scholar
6. Tertian, R., “Quantitative X-Ray Fluorescence Analysis Using Solid Solution Specimens - A Theoretical Study of the Influence of the Quality of Primary Radiation,” Spectrochim. Acta 26B, 71 (1971).Google Scholar
7. Harmon., J. C., Wyld, G. E., Yao, T. C., and Otvos, J. W., “X-Ray Fluorescence Analysis of Stainless Steels and Low Alloy Steels Using Secondary Targets and the EXACT Program,” presented at the Denver Conference on Applications of X-Ray Analysis, Denver, Colo., Aug, 4, 1978.Google Scholar
8. Rasberry, S. D. and Heinrich, K. F. J., “Calibration for Interelement Effects in X-Ray Fluorescence Analysis,” Anal. Chem. 46, 81 (1974).Google Scholar
9. Criss, J. W., Birks, L. S. and Gilfrich, J. V., “A Versatile X-Ray Analysis Program Combining Fundamental Parameters and Empirical Coefficients,” Anal. Chem. 50, 33 (1978).Google Scholar