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Polarized Radiation Produced by Scatter for Energy Dispersive X-ray Fluorescence Trace Analysis*

Published online by Cambridge University Press:  06 March 2019

Richard W. Ryon
Richard W. Ryon*
Affiliation:
University of California Lawrence Livermore Laboratory Livermore, California 94550
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Abstract

Polarized x-radiation produced by scatter at 90° from boron carbide is shown to be a superior excitation source for the measurement of trace elements by energy dispersive x-ray fluorescence. In a close-coupled system which uses a high power x-ray tube as the primary source, the losses due to the geometric requirements and scattering efficiency of the polarizer can be more than compensated. With the system described here which uses a Mo anode x-ray tube, detection limits for the element between K and Sr in NBS orchard leaves are approximately 2 to 4.5 times lower using polarized excitation in comparison to direct excitation, and about <1 to 3 times lower in comparison to secondary excitation.

Type
X-Ray Instrumentation
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 575 - 590
Copyright
Copyright © International Centre for Diffraction Data 1976

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Footnotes

*

This work performed under the auspices of the U. S. Energy Research&Development Administration, under contract No. W-7405-Eng-48.

References

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