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Performance of an Unattended Automated X-Ray Spectrograph

Published online by Cambridge University Press:  06 March 2019

C. M. Davis
Affiliation:
International Nickel Company, Inc. Bayonne, New Jersey
M. M. Yanak
Affiliation:
International Nickel Company, Inc. Bayonne, New Jersey
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Abstract

Among the advantages of the X-ray spectrograph is the economy realised by minimizing the time of analysis. In the past few years automated features have been developed and applied to reduce analysis time further and to minimize operator errors. These have included a programmed goniometer, an automatic crystal changer, a digitized printer or automatic typewriter, and recently an automatic sample loader coupled with a programmer. With this last attachment, unattended analysis of solid metal samples has been achieved. The precision of data obtained automatically compares favorably with similar data obtained manually.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1963

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References

1. McCune, R. A., Mueller, W. M., and Dunton, P. J., “Feasibility of the X-Ray Spectrograph as a Continuous Analytical Instrument for Process Control,” Advances in X-Ray Analysis, Vol. 1, University of Denver, Plenum Press, New York, 1960, p. 399.Google Scholar
2. Deichert, R. W. and O'Connor, J. P., “A Review of Process Control Instrumentation Development,” Norelco Reporter 10: 43, 1963.Google Scholar
3. Hasler, M. F. and Winchester, C. L., Ind, Res. 28: December 1962.Google Scholar
4. Liebhafslcy, H. A., Winslow, E. H., and Pfeiffer, H. G., “X-Ray Absorption and Emission,” Anal. Chem. 34: 282R, 1962.Google Scholar
5. Campbell, W. J., “Apparatus for Continuous Fluorescent X-Ray Spectrographic Analysis of Solutions,” Appl. Spectroscopy 14: 26, 1960.Google Scholar
6. Fischer, J. F., Norelco Reporter 6: 64, 1959.Google Scholar
7. Bebr, F. A., “The Autrometer—An Automatic Comparison Spectrometer,” Noreko Reporter 3: 80, 1956.Google Scholar
8. Adler, I., “Apparatus for Automatic Measurement in Multichannel X-Ray Spectroscopy,” Norelco Reporter 3: 54, 1956.Google Scholar
9. Abrahams, S. C., “Automation in X-Ray Crystallography,” Chem. and Bug. News 41: 108, June 3, 1963.Google Scholar
10. “Automatic Programming,” Hilger and Watts, Ltd., Metallurgia 67: 44, January 1963.Google Scholar