Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-27T05:41:17.203Z Has data issue: false hasContentIssue false
  • English
  • Français

Peak Height Approximation for X-Ray Diffracted Integrated Intensity

Published online by Cambridge University Press:  06 March 2019

C. P. Gazzara
C. P. Gazzara*
Affiliation:
Army Materials and Mechanics Research Center Watertown, Massachusetts 02172
Get access

Abstract

A fast X-ray diffraction powder method of quantitative analysis has been developed and demonstrated using mixtures of alpha and beta silicon nitride and silicon.

An analytical procedure, assuming both Gaussian and Cauchy diffracted characteristic line distributions, was used to synthesize CuKα X-ray peaks in the 2θ range 20° to 50° with peak widths from 0.1° to 0.4° 2θ. The relationship of peak height to integrated intensity was established as a function of peak width and tested using pure silicon powder with variable receiving slit widths from 0.01° to 0.40° 2θ.

Concentration calibration curves for silicon nitride and silicon were corrected for extinction and preferred orientation with statistical figures of merit to indicate the extent of preferred orientation.

Preliminary results indicate that this procedure may be used for cold-worked materials.

Type
X-Ray Diffraction Applications
Information
Advances in X-Ray Analysis , Volume 19: Twenty-Fourth Annual Conference on Applications of X-ray Analysis, August 6-8, 1975 , 1975 , pp. 735 - 748
Copyright
Copyright © International Centre for Diffraction Data 1975

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Klug, H. P. and Alexander, L. E., “X-Ray Diffraction Procedures,” John Wiley and Sons, Inc., New York (1954).Google Scholar
2. “Standard X-Ray Diffraction Powder Patterns,” National Bureau of Standards, Monogs, 25, U.S. Printing Office, Washington, D. C.Google Scholar
3. Smith, D. K., “Computer Simulation of X-Ray Diffractometer Traces.” Norelco Reporter, 57 (April-June 1968).Google Scholar
4. Gazzara, C. P. and Messier, D. R., “Quantitative Determination of Phase Content of Silicon Nitride by X-Ray Diffraction Analysis,” Army Materials and Mechanics Research Center, AMMRC TR 75-4, (February 1975).Google Scholar
5. Rau, R. C., “Measurement of Crystallite Size by Means of X-Ray Diffraction Line-Broadening,” Norelco Reporter, X, No. 3, 114 (1963).Google Scholar
6. Jones, F. W., “Measurement of Particle Size by the X-Ray Method,” Proc. Roy. Soc., (London), 166A, 16 (1938).Google Scholar
7. Wilson, A. J. C., “Determination of Absolute from Relative X-Ray Intensity Data,” Nature, 150, 152 (1942).Google Scholar
8. Thewlis, J., “An X-Ray Powder Study of β-Uranium,” Acta Cryst., 5, 790 (1952).Google Scholar
9. Borie, B., “Independent Measurement of the Atomic Scattering Factor and the Debye Factor,” Acta Cryst., 9, 617 (1956).Google Scholar
10. Gazzara, C. P., “The Debye Temperature of Carbonyl Iron,” Adv. X-Ray Anal., 4, 93 (1960).Google Scholar
11. Gazzara, C. P., Middleton, R. M., Weiss, R. J., and Hall, E. O., “A Refinement of the Parameters of a Manganese,” Acta Cryst., 22, 859 (1967).Google Scholar
12. Weiss, R. J., “X-Ray Determination of Electron Distributions,” North Holland Publishing Co., Amsterdam, 44 (1966).Google Scholar