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PC-Based Management and Analysis of X-Ray Residual Stress Data

Published online by Cambridge University Press:  06 March 2019

S. B. Courtney ,
M. J. Tricard  and
R. W. Hendricks
S. B. Courtney
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University Blacksburg, VA 24061
M. J. Tricard
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University Blacksburg, VA 24061
R. W. Hendricks
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University Blacksburg, VA 24061
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Abstract

The authors have developed two independent software packages that store x-ray peak locations, integrated intensities and full-width half-maximum intensity data as a function of diffractometer tilt and orientation angle; this information is used to compute residual stress tensor values. Each program retrieves the fitted x-ray peak locations from a dBASE-compatible data set that is independent of both x-ray diffractometer and acquisition software. Machine-specific routines have been coded to transfer peak data and general diffraction setup information from several different x-ray acquisition platforms into this common format. The two database management programs provide stand-alone storage, retrieval, analysis and graphic output of data, and thus have become practical laboratory vehicles toward establishing a standard database format for storing x-ray strain measurements and the residual stress values calculated therefrom.

Type
IX. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 535 - 541
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

1. Courtney, S.B., Potet, J., Tricard, J.M. and Hendricks, R.W., “RS/base: A Residual Stress Database Management System,” Residual Stresses - III: Proceedings Third Internationa! Conference on Residual Stress, Tokushima, Japan, July 23-26, 1991, H. Fujiwara, T. Abe and K. Tanaka, eds., Amsterdam: Elsevier (1992), pages 1549-1554.Google Scholar
2. Potet, I., “Data Flow Programs for the Creation of an Expert System to Validate and Interpret the Measurements of Residual Stress by X-ray Diffraction,” Projet de Fin d'Etudes, ENSAM, (May 1991).Google Scholar
3. Courtney, S.B. “A Database Management System for X-ray Residual Stress Data,” Senior Project Report, Virginia Polytechnic Institute and State University, (April 1991).Google Scholar
4. Tricard, M.J., Hendricks, R.W. and Guillot, M., “An Expert System for the Validation and Interpretation of X-Ray Residual Stress Data,” Advances in X-ray Analysis, Vol. 34, pp. 601–610, (1990).Google Scholar
5. Tricard, M.J., Courtney, S.B., Potet, J., Guillot, M. and Hendricks, R.W., “RS/Xpert: An Expert System for Residual Stress Measurements,” Residual Stresses - HI: Proceedings Third International Conference on Residual Stress, Tokushima, Japan, July 23-26, 1991, H. Fujiwara, T. Abe and K. Tanaka, eds., Amsterdam: Elsevier (1992), pages 1019-1024.Google Scholar