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The On-Stream X-Ray Analysis of Slurries for Process Control

Published online by Cambridge University Press:  06 March 2019

Johann P. Engelbrecht ,
Johan P.R. de Villiers  and
Stefan W. de Bruyn
Johann P. Engelbrecht
Affiliation:
Mineralogy Division Mintek Private Bag X3015 2125 Randburg South Africa
Johan P.R. de Villiers
Affiliation:
Mineralogy Division Mintek Private Bag X3015 2125 Randburg South Africa
Stefan W. de Bruyn
Affiliation:
Mineralogy Division Mintek Private Bag X3015 2125 Randburg South Africa
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Abstract

An integrated XRD-XRF system for the on-stream analysis of slurries was configured to the requirements of industry for process control. The slurry-handling system includes a multiplexer, header tank, de-aerator and a windowless sample presenter. The XRD part of the system is composed of a molybdenum anode X-ray tube, a pyrolytic graphite primarybeam monochromator, a vertical fixed-geometry goniometer, and a simultaneous detector system. The X-ray beam is transmitted through the slurry curtain so that the diffracted intensities are measured in the forward diffracted mode. The energy-dispersive XRF spectrometer measures the reflected fluorescence intensities. Examples and data from the onstream XRD analysis of fluorspar and apatite are presented. Mention is made of the application of an integrated XRD-XRF system in the heavy-minerals and base-metal industries.

Type
IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 661 - 672
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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