Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-05T05:05:56.186Z Has data issue: false hasContentIssue false
  • English
  • Français

On the use of Synchortron Radiation for the Study of the Mechanical Behaviour of Materials

Published online by Cambridge University Press:  06 March 2019

Marc Barral ,
Jean-Michel Sprauel ,
Jean-Lou Lebrun ,
Gérard Maeder  and
Stephan Megtert
Marc Barral
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151, Boulevard de l'Hôpital, 75640 Paris Cedex 13, France, Lure, Bat 209 C, UPS, 91405 Orsay, France
Jean-Michel Sprauel
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151, Boulevard de l'Hôpital, 75640 Paris Cedex 13, France, Lure, Bat 209 C, UPS, 91405 Orsay, France
Jean-Lou Lebrun
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151, Boulevard de l'Hôpital, 75640 Paris Cedex 13, France, Lure, Bat 209 C, UPS, 91405 Orsay, France
Gérard Maeder
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151, Boulevard de l'Hôpital, 75640 Paris Cedex 13, France, Lure, Bat 209 C, UPS, 91405 Orsay, France
Stephan Megtert
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151, Boulevard de l'Hôpital, 75640 Paris Cedex 13, France, Lure, Bat 209 C, UPS, 91405 Orsay, France
Get access

Extract

The study of the mechanical behaviour of materials by X-ray measurements in a classical laboratory is limited by the possibilities of the X-ray tubes used. Some crystallographic planes are not conducive to good diffraction conditions and the radiation characteristics' may not be optimum. The use of synchrotron radiation resolves many of these problems by providing a continuously variable wavelength which allows measurements of stress and stress gradients to be carried out in very good conditions. The high intensity and perfectly monochromated radiation with a small beam divergence are very helpful for microstrain measurements.

Type
II. X-Ray Strain and Stress Determination
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 149 - 158
Copyright
Copyright © International Centre for Diffraction Data 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1-Dagneaux, P.. et al, L'utilisation du rayonnement synchrotron en France (The use of synchrotron radiation in France), Ann. Phys., 9, 1975, pp. 9–65 Google Scholar
2-Barral, M., Mesures de contraintes rgsiduelles par diffraction des rayons X sur des materiaux presentant une texture cristallographique (X-ray residual stress measurements on materials with a cristallographic texture), Doct.-Ing. thesis, Universite PARIS VI,1983.Google Scholar
3-Brackman, C. M., Residual stresses in cubic materials with orthorhombic or monoclinic specimen symmetry:influence of texture on ψ splitting and non-linear behaviour, J. Appl. Cryst., 16, 1983, pp. 325–340 Google Scholar
4-Dolle, H., Hauk, V., Rontgenographische Ermittlung von Eigenspannungen in texturierten Werkstoffen (X-ray determination of residual stresses on textured materials), Z. Metallkde, 70, 1979, pp. 682–685 Google Scholar
5-Dolle, H., Hauk, V., Einfluss der mechanischen Anisotropie des Vielkristalls(Textur) auf die rontgenographische Spannungsermittlung (Influence of the mechanical anisotropy of polycrystals (texture) on the X-ray determination of stresses), Z. Metallkde, 69, 1978, pp. 410–417 Google Scholar
6-Dolle, H., Cohen, J.B., Evaluation of (residual) stresses in textured cubic metals, Met. Trans., 11A, 1980, pp. 831–836 Google Scholar
7-Sprauel, J.M., Barral, M., Torbaty, S., Measurements of stress gradients by X-ray diffraction, Adv. in X-ray Anal., 26, 1982, pp. 217–224 Google Scholar
8-Warren, B. E., “X-ray diffraction”, Addison Wesley P.C., USA,1969Google Scholar
9-Wagner, C. N. J., In “Local atomic arrangements studied by X-ray diffraction”, ed. Cohen, J. B. and Hilliard, J. E., Gordon and Breach, New-York, 1965, pp. 219–270 Google Scholar