Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-05T13:52:16.433Z Has data issue: false hasContentIssue false
  • English
  • Français

A Novel Approach to Discrimination in X-Ray Spectrographic Analysis

Published online by Cambridge University Press:  06 March 2019

Paul Lublin
Paul Lublin*
Affiliation:
Sylvania Research Laboratories A Division of Sylvania Electric Products Inc., Bayside, N. Y.
Get access

Abstract

There are various methods for handling the problem of interferences. One may me one of the weaker lines of the trace clement, but this results in considerable loss in the limit of detectability of this element. One may try pulse height discrimination techniques, but because of the linearity limitations of present day pulse height analyzers, complete elimination of the higher energy wave length is not possible. Another possible technique is to lower the kilovoltage below the excitation potential of the interfering element. This is satisfactory, but again the limit of detectability is raised for the trace element. There are many other “devices” which may be tried, but all of these involve a loss in sensitivity in the determination of the trace element.

The “novel” approach involves the use of an analyzing crystal whose second order reflection is missing due to crystal structure considerations. Germanium or silicon, cut so that (111) planes are parallel to the surface of the crystal, would be satisfactory analyzers for this purpose. The use of one of these crystals and the application of this method to the niobium-tantalum and zirconium-hafnium systems are discussed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 2: Seventh Annual Conference on Industrial Applications of X-ray Analysis, August 13-15, 1958 , 1958 , pp. 229 - 237
Copyright
Copyright © International Centre for Diffraction Data 1958

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Mortimore, D. M., Noble, L. A., Analytical Chemistry, Vol. 25, 1953, p. 296.Google Scholar
2 Blunt, B. R., Kingsbury, G. W. J., Temple, R. B., CRL-AE-67.Google Scholar
3 Mackintosh, W. D., Jervis, R. E., Analytical Chemistry, Vol. 30, 1958, p. 1180.Google Scholar
4 Birks, L. S., Brooks, E. J., Analytical Chemistry, Vol. 22, 1950, p. 1017.Google Scholar
5 Campbell, W. J., Carl, H. F., Analytical Chemistry, Vol. 26, 1954, p. 800.Google Scholar
6 Mortimore, D. M., Romans, P. A., Tews, J. L., Applied Spectroscopy, Vol. 8, No. 1, 1954, p. 24.Google Scholar
7 Vainshtein, E. E., Journal Analytical Chemistry USSR. Vol. 10, 1955, p. 11.Google Scholar
8 Moak, W. D., paper presented at GE X-ray Symposium, April 17, 1957.Google Scholar
9 Kiley, W., personal communication.Google Scholar