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A New Commercial X-Ray Projection Microscope*

Published online by Cambridge University Press:  06 March 2019

Ong Sing Poen
Ong Sing Poen*
Affiliation:
Pomona College, Claremont, California
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Abstract

A recently developed Dutch commercial projection X-ray microscope will be described. The principal features are: simplified focusing by using reflected electrons, four different target materials exchangeable during operation, and hlnocular viewing of either the specimen itself or the fluorescent image. The specimen and film chamber is evacuated and the voltage is variable between 5 and 20 kv. Some results will be shown.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 4: Ninth Annual Conference on Applications of X-ray Analysis, August 10-12, 1960 , 1960 , pp. 301 - 308
Copyright
Copyright © International Centre for Diffraction Data 1960

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Footnotes

*

Current work supported by the U. S. Air Force Office of Scientific Research at Pomona College.

References

1. Cosslett, V. E. and Nixon, W. C., Natl. Bur. Stand. Symposium, 1951, p. 257.Google Scholar
2. Poen, Ong Sing and Le Pools, J. B., Appl. Sci, Res., Vol. B7, 1958, p. 233.Google Scholar
3. Kramer, J., Technical Physics Department, T.N.O, and T. H., personal communication.Google Scholar