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Published online by Cambridge University Press: 06 March 2019
A neutron powder diffractometer at the University of Missouri Research Reactor (MURR) uses a linear position sensitive detector (PSD) which has increased both resolution and data acquisition rates. Rietveld analysis works as well with this system as with more conventional single and multi- Soller slit detector systems. This analysis has been successfully applied to problems involving more than 75 parameters and 1200 reflections and a future instrument upgrade should allow analyses which involve 100-150 parameters. A special advantage of the PSD instrument is that it needs only small (1-2 gm) samples to achieve high statistical accuracy.