Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T12:27:53.179Z Has data issue: false hasContentIssue false
  • English
  • Français

Modified NRLXRF Program for Energy Dispersive X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

R.B. Shen ,
J. Criss ,
J.C. Russ  and
A.O. Sandborg
R.B. Shen
Affiliation:
EDAX International, Inc., P.O. Box 135, Prairie View, IL 60069
J. Criss
Affiliation:
EDAX International, Inc., P.O. Box 135, Prairie View, IL 60069
J.C. Russ
Affiliation:
EDAX International, Inc., P.O. Box 135, Prairie View, IL 60069
A.O. Sandborg
Affiliation:
EDAX International, Inc., P.O. Box 135, Prairie View, IL 60069
Get access

Extract

An X-ray fluorescence program, similar to NRLXRF2 has been written by John Criss to fit into the DEC LSI-11 32K computer with floppy disk system. EDAX has combined the new version with our own software to create a set of FORTRAN programs, called “XRAY 95” to use with the new EDAX EXAM 9500 energy dispersive X-ray fluorescence system. The XRAY 95 program employs both fundamental-parameter equations and influence coefficient equations to optimize the matrix corrections for multicomponent samples. It is an extremely versatile program, using whatever reference standards the user provides and supplementing them with physical theory. The result is a practical approach to fast, accurate analysis.

Type
Mathematical Methods in XRF
Information
Advances in X-Ray Analysis , Volume 23: Twenty-Eighth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1979 , 1979 , pp. 99 - 110
Copyright
Copyright © International Centre for Diffraction Data 1979

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Criss, J.W., 28th Annual Conf . on Applications of X-ray Analysis, Denver, Colorado, (1979).Google Scholar
2. Criss, J.W., Birks, L.S., and Gilfrich, J.V., Anal. Chem. 50, 33 (1978).Google Scholar
3. A description of the method is on page 41, COSMIC, DOD-00065, Suite 112 Barrow Hall, Athens, Georgia.Google Scholar
4. Shen, R., Russ, J. & Stroeve, W., Adv. in X-ray Anal. Vol. 22, p. 385, (1979).Google Scholar
5. Rasberry, S. & Heinrich, K., Anal. Chem. 46, 81 (1974).Google Scholar