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A Modification of the Scanning X-Ray Topographic Camera (Lang's Method)

Published online by Cambridge University Press:  06 March 2019

Mitsuru Yoshimatsu ,
Atsushi Shibata  and
Kazutake Kohra
Mitsuru Yoshimatsu
Affiliation:
Rigaku Denki Company Ltd., Haijinta, Akishima, Tokyo, Japan
Atsushi Shibata
Affiliation:
Rigaku Denki Company Ltd., Haijinta, Akishima, Tokyo, Japan
Kazutake Kohra
Affiliation:
University of Tokyo, Bunkyo-ku, Tokyo, Japan
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Abstract

A modification of the scanning X-ray topographic camera, is reported. The specimen and photoplate are traversed back and forth independently in two directions rather than in the same direction as in the case of Lang’s camera. The distortions of the photographs caused by geometrical arrangement can be eliminated through this construction so as to have a one-to-one correspondence. Examples of reflection photographs as well as transmission photographs are shown. Some of them are compared with those taken using Lang’s camera. The dislocation images in the reflection photographs show a good one-to-one correspondence to those in the transmission photographs. The broadening of the dislocation images in the traversing direction is discussed. The present camera is especially useful for the studies of lattice defects in the thick specimens because the reflection photographs can be easily taken.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 14 - 22
Copyright
Copyright © International Centre for Diffraction Data 1965

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References

1. Berg, Wolfgang, “An X-Ray Method for Study of Lattice Disturbances of Crystals,” Naturwiss. 19: 391–396, 1931.Google Scholar
2. Barrett, C. S., “A New Microscopy and its Potentialities,” Trans. AIME 161: 15–65, 1945.Google Scholar
3. Newkirk, J. B., “Observations of Dislocations and Other Imperfections by X-Ray Extinction Contrast,” Trans. AIME 215: 483–497, 1959.Google Scholar
4. Lang, A. R., “The Projection Topograph : A New Method in X-Ray Diffraction Microradiography,” Acta Cryst. 12: 249–250, 1959.Google Scholar