Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-23T12:28:44.077Z Has data issue: false hasContentIssue false

Microdiffraction With Synchrotron Beams (Or Ultra-High Pressure Research)

Published online by Cambridge University Press:  06 March 2019

E. F. Skelton*
Affiliation:
Condensed Matter and Radiation Sciences Division Naval Research Laboratory, Washington, DC 20375-5000
Get access

Extract

Pressure is an important thermodynamical variable. It provides the most efficient means of altering interatomic distances while leaving the thermal energy of a system invariant. It therefore provides an important mechanism for testing theoretical models that are based upon atomic separations and crystallographic configurations. Like its counterpart, temperature, pressure can be used to assist chemical reactions or to bring about crystallographic phase transformations. New allotropes, formed under conditions of extreme pressure and/or temperature, may have physical properties that are significantly different from those of the material formed under normal conditions. A classic example is that of carbon: the hardness, electrical and thermal conductivities, transparency, and cost of graphite, the normal phase of carbon, are significantly different from those of diamond, the phase formed at elevated pressures and temperatures. In the quest for higher static pressures, researchers have been reducing the size of the pressure chamber, and hence the sample, to microscopic dimensions; this, in turn, necessitates the use of brighter light sources to "see" the sample in a reasonable time period.

Type
I. Microbeam Techniques and Imaging Methods for Materials Characterization
Copyright
Copyright © International Centre for Diffraction Data 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] For a recent review of the field of high pressure research, see Skelton, E. F. and Webb, A. W., “Research at High Pressures,” in Encyclopedia of Physical Science and Technology , edited by Yelles, M., (Academic Press, San Diego, CA; 1987), Vol. 11, pp. 256276 Google Scholar
[2] The S.l. unit of pressure is the Pas cai( Pa), defined as 1 Newton per m2 ; another: unit of pressure frequently used is the bar, defined as 1 dyne per cm2. At sea level, atmospheric pressure is 0.10133 MPa or equivalently, 1.0133 bars; typical static research pressures range from a few GPa (tens of kbars) to several hundred GPa (several Mbar),Google Scholar
[3] For a review of the design, development, and application of the diamond-anvil cell in high pressure research, see Jayaraman, A., Rev. Mod. Phys. 55, 65 (1983); Sci, Am., April, 1984, p. 54.Google Scholar
[4] Moss, W.C., Hallquist, J.O., Reichiin, R., Goettel, K. A., and Martin, S., Appi. Phys. Lett. 48, 1258 (1986).Google Scholar
[5] Xu, J.A., Mao, H.K., and Bell, P.M., Science 232, 1404 (1986).Google Scholar
[6] Webb, A.W., Gubser, D.Ü., and Towle, L.C., Rev. Sci. Instrum. 47, 59 (1984).Google Scholar
[7] Skelton, E.F., Webb, A.W., Schaefer, A.W., Schiferl, D., Katz, A.I., Hochheimer, H.D., and Qadri, S.B., Adv. X-Ray Anal. 30, 465 (1987).Google Scholar
[8] Ming, L.-C. and Bassett, W.A., Rev. Sci. Instrum. 45, 290 (1974).Google Scholar
[9] Mao, H.K., Bell, P.M., Shaner, J.W., and Steinberg, D.J., J. Appl. Phys. 49, 3276 (1978).Google Scholar
[10] Gilfrich, J.V., Skelton, E.F., Nagel, D.J., Webb, A.W., Qadri, S.B., and Kirkland, J.P., Adv. X-Ray Anal. 26, 313 (1983).Google Scholar
[11] An excellent review of the properties and applications of synchrotron produced radiation has recently been published by Professor Herman Winick of the Stanford Synchrotron Radiation Laboratory: Winik, H., Scientific American, Nov., 1987; pp. 8899.Google Scholar
[12] Skelton, E.F., Physics Today, Sep., 1984; pp. 4452.Google Scholar
[13] Skelton, E.F., Webb, A.W., Qadri, S.B., Wolf, S.A., Lacoe, R.C., Feldman, J. L., Elam, W.T., Carpenter, E.R. Jr.,, and Huang, C.Y., Rev. Sci. instrum. 55, 849 (1984).Google Scholar
[14] Brister, K.E., Vohra, Y.K., and Ruoff, A.L., to be pub. in Rev. Sci. instrum., 1987.Google Scholar
[15] Hazen, R.M., Mao, H.K., Finger, L.W., and Hemley, R.J., Phys. Rev. 36, 3944 (1987).Google Scholar
[16] Vohra, Y.K., Duclos, S.J., Brister, K.E., and Ruoff, A.L., Rev. Sci. Instrum. 58, 1887 (1987).Google Scholar
[17] The High Pressure Insertion Device Team (HP-IDT) at NSLS consists of representatives drawn from the following institutions: Bell Laboratories, Carnegie Institute of Washington, Cornell University, Exxon Research Laboratory, Lawrence Livermore National Laboratory, Los Alamos National Laboratory, Naval Research Laboratory, State University of New York at Stony Brook, University of California at Berkeley, University of Hawaii, and University of Washington. Additional information about this group and the availability of the high pressure beamline at NSLS can be obtained from the author.Google Scholar
[18] Skelton, E.F., “High Pressure/Variable Temperature Studies,” in Report of the Work shop on the Scientific Case of a 6-GeV Synchrotron Source, edited by Hodgson, K. O. and Cohen, J.B., Argonne National Laboratory, Argonne, IL, 1985; pp. 135-I40.Google Scholar
[19] Belakhovsky, M. and Vettier, C., Report on the ESRF High Pressure Workshop , European Synchrotron Radiation Facility, BP 220 - F38043 Grenoble Cedex, 1987.Google Scholar
[20] Ayers, J.D., Elam, W.T., Void, C.L., Qadri, S.B., Skelton, E.F., and Webb, A.W., Rev. Sci. Instrum. 56, 712 (1985).Google Scholar