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Microcrystalline Properties of Quartz by Means of Xrpd Measures

Published online by Cambridge University Press:  06 March 2019

Giovanni Berti
Giovanni Berti*
Affiliation:
Dipartimento di Scienze della Terra - Univ. di Pisa Via S. Maria 53 -56126 Pisa-Italy
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Extract

Different diffraction patterns were compared one to the other in order to evaluate the contribution of different effects: Thus, in order to arrive at observing true differences between the patterns, “Diffraction Instrumental Monitoring” was adopted to assess reproducibility, stability, as well as differences in the instrumentation set up. To this end aberrations affecting peaks centroid position and variance were taken into account, Moreover the variation of variance of single peaks was analysed to achieve information on microcrystalline properties of real crystalline lattices.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 359 - 366
Copyright
Copyright © International Centre for Diffraction Data 1993

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