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Microcrystalline Properties of Quartz by Means of Xrpd Measures

Published online by Cambridge University Press:  06 March 2019

Giovanni Berti
Giovanni Berti*
Affiliation:
Dipartimento di Scienze della Terra - Univ. di Pisa Via S. Maria 53 -56126 Pisa-Italy
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Extract

Different diffraction patterns were compared one to the other in order to evaluate the contribution of different effects: Thus, in order to arrive at observing true differences between the patterns, “Diffraction Instrumental Monitoring” was adopted to assess reproducibility, stability, as well as differences in the instrumentation set up. To this end aberrations affecting peaks centroid position and variance were taken into account, Moreover the variation of variance of single peaks was analysed to achieve information on microcrystalline properties of real crystalline lattices.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 359 - 366
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

Baharie, E., Pawley, G.S., (1983), Counting Statistics and Power Diffraction Scan Refinements. J.Appl. Cryst., 16, 404.Google Scholar
Berti, G. (1993), Variance and Centroid optimization in X-ray Powder Diffraction Analysis, Powder Diffraction,8, 87.Google Scholar
Berti, G., Bertoli, M., Burattini, E., Cappuccio, G., Menichini, R., Simeoni, S., (1992), Physical and Mineralogical Features of Polycrystalline Samples Obtained by means of Conventional and Synchrotron XRD Techniques. Material Science Forum, 133-136, 753.Google Scholar
Berti, G., Danzi, M., Marzoni Fecia, di Cossato Y., Odierna, M., (1991), Wet Micro-mesh Sieving for X-ray Powder Diffractometric Purposes: Performance, Efficiency and Granulomere Dispersion of the Screening. Per. Mineral. 60, 21.Google Scholar
Bish, D.L., Reynolds, R.C. Jr.,(1989), Sample Preparation for X-ray Diffraction, in:“Modern Powder Diffraction, Reviews in Mineralogy” Vol.20, 73.Google Scholar
Cowley, J.M., (1976), “Diffraction by Crystals with planar faults”, Acta Cryst., A32, 83.Google Scholar
Jansen, E., Schafer, W., Will, G., (1988), Profile fitting and the Two Stage Methods in Neutron Powder Diffractometry for Structural and Textural Analysis, J. Appl. Cryst. 21, 228.Google Scholar
Lang, A.R., (1957), The Study of Multiple Reflections with the Aid of a Microfocus X-Ray source. Acta Cryst. 10, 252.Google Scholar
Lang, A.R.,(1959), Studies of individual dislocations in crystal by X-ray diffraction micrographies, J. Appl. Phys., 30, 1748.Google Scholar
Langford, J.I.,(1982), The Variance as a Measure of Line Broadening: Correction for truncation, Curvature and Instrumental Effects, J. Appl. Cryst., 15, 315.Google Scholar
Langford, I.J.,(1992), The use of the Pseudo-Voigt Function in Determining Micro structural Properties from Diffraction Data by means of Pattern Decomposition. NIST sp.pub.846 Gaithersburg MD,110.Google Scholar
Langford, I.J. Wilson, A.J.C. (1963), On variance as a measure of line Broadening in Diffractometry: Some Preliminary Measurements on Anealled Aluminium and Nickel and on Cold worked Nickel, in “Crystallography and Crystal Perfection”, Ramachandran Ed. Ace,Press.207.Google Scholar
Louer, D., Auffredic, J.P., Langford, J.I., Ciosmak, C.D., Niepce, J.C.,(1983), A Precise Determination of Shape, Size, and Distribution of Size of Crystallites in Zinc Oxide by X-ray Line Broadening. J.Appl. Cryst., 16, 183.Google Scholar
Mitra, G.B., Halder, N.C.,(1964), Stacking Fault probabilities in Hexagonal Cobal:. Acta Cryst. 17, 817.Google Scholar
Murata, K.J., Norman, N.B.,(1976), An Index of Crystailinity for Quartz. Am.J.Sc, 276, 1120.Google Scholar
Ruland, W.,(1961), X-ray determination of Crystallinity and Diffuse Disorder Scattering, Acta Cryst., 14, 1180.Google Scholar
Stratton, R.P., Kitchingam, W.J. (1965), Staking Fault Densities in Hexagonal Silver Alloys. Brit J.Appl. Phys. 16, 1311.Google Scholar
Weber, K., (1972), Note on determination of illite crystallinity. N. Jah., f. Min., 267.Google Scholar
Wilson, A.J.C., (1963), The Mathematical Theory of X-Ray Powder Diffraction, Philips Tech Lib.Google Scholar