Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-20T06:40:09.707Z Has data issue: false hasContentIssue false

A Microcomputer Controlled Diffractometer

Published online by Cambridge University Press:  06 March 2019

R. P. Goehner
Affiliation:
General Electric Company Schenectady, New York 12301
W. T. Hatfield
Affiliation:
General Electric Company Schenectady, New York 12301
Get access

Extract

Automated powder diffractometers are beginning to come into general use. The principal reason for automating or purchasing an automated powder diffractometer is to increase the speed and accuracy of the analysis. Three principal methods are used. The first is that a multisample changer increases the through-put on the instrument since the unit can be operated unattended during the evening. The second is the diffractometer can be scanned at faster rates when digital data are collected, as opposed to the analog method of using a strip chart recorder. The third is the elimination of reading the peak positions and intensities from the strip charts. These readings would typically have to be tabulated manually for later interpretation. Another reason for having an automated powder diffractometer is for experiments where digital data are necessary to make the analysis practical. These experiments include routine quantitative analysis, radial distribution functions, Fourier profile analysis, and signal averaging to bring out very weak diffraction peaks.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1978

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Jenkins, R., Haas, D., and Paoline, F. R., Norelco Reporter, 18, 1227, (1972).Google Scholar
2. Jenkins, R., and Westberg, R. G., Advances in X-Ray Analysis, 16, 310321 (1973).Google Scholar
3. Holland, H. J., and Medrud, R. C., J. Appl. Cryst., 10, 386389, (1977).Google Scholar
4. King, P. J. and Smith, W. L., J. Appl. Cryst., 7, 603608 (1974).Google Scholar
5. Parrish, W., Huang, T. C., and Ayers, G. L., Trans. ACA 12, 5573 (1976).Google Scholar
6. Kelly, C. J. and Gagliardi, C. A., Proc. IEEE 63, 1426-1431 (1975).Google Scholar