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Microanalysis with Ultrasoft X-Radiations*

Published online by Cambridge University Press:  06 March 2019

Burton L. Henke
Burton L. Henke*
Affiliation:
Pomona College, Claremont, California
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Abstract

The diffraction, reflection, absorption, fluorescence, and the electronic emission that results from the interaction with ultrasoft X-rays (λ > 10 A) are presented as practical bases for microanalysis. Recent developments on sources and detectors for the ultrasoft X-radiations are described. A preliminary report on a current investigation on low-energy photo-Auger electron analysis and on a new type of low-energy electron spectrometer is also presented.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 285 - 305
Copyright
Copyright © International Centre for Diffraction Data 1961

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Footnotes

*

This work is supported by the U.S. Air Force Office of Scientific Research.

References

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