Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-08T09:18:04.311Z Has data issue: false hasContentIssue false
  • English
  • Français

The Measurement of Elastic Constants for the Determination of Stresses by X-Rays

Published online by Cambridge University Press:  06 March 2019

K. Perry ,
I.C. Noyan ,
P.J. Rudnik  and
J.B. Cohen
K. Perry
Affiliation:
Department of Materials Science, The Technological Institute, Northwestern University, Evanston, Illinois,60201
I.C. Noyan
Affiliation:
Department of Materials Science, The Technological Institute, Northwestern University, Evanston, Illinois,60201
P.J. Rudnik
Affiliation:
Department of Materials Science, The Technological Institute, Northwestern University, Evanston, Illinois,60201
J.B. Cohen
Affiliation:
Department of Materials Science, The Technological Institute, Northwestern University, Evanston, Illinois,60201
Get access

Extract

Residual and applied stresses (σij) are often measured via X-ray diffraction, by calculating the resultant elastic strains (ϵij) from the measured change in interplanar spacing (“d”). This method is non-destructive, reasonably reproducible (typically ±14 MPa), can be carried out in the field, and is readily automated to give values to an operator-specified precision , Let Li represent the axes of the measuring system with L3 normal to the diffracting planes, and Pi represent the sample axes. These axes are illustrated in Figure 1. In what follows, primed stresses and strains are in the laboratory system, while unprimed values are in the sample system.

Type
II. X-Ray Strain and Stress Determination
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 159 - 170
Copyright
Copyright © International Centre for Diffraction Data 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. James, M.R. and Cohen, J.B., “PARS“-A Portable X-ray Analyzer for Residual Stresses, J. of Testing and Evaluation, 6:91 C1978).Google Scholar
2. James, M.R. and Cohen, J.B., Study of the Precision of X-Ray Stress Analysis, Adv. in X-Ray Anal., 20:291 (1977).Google Scholar
3. Dolle, H., The Influence of Multiaxial Stress States, Stress Gradients, and Elastic Anisotropy on the Evaluation of (Residual) Stress by X-Rays, J. Appl. Crystal., 12:489 (1979).Google Scholar
4. Dolle, H. and Hauk, V., Einfiuss der mechanischen Anisotropie des Vielkristalls (Textur) auf die rontgenographische Spannungsermittlung, Z. Metallkunde, 69:410 (1978).Google Scholar
5. Dolle, H. and Cohen, S. B., Residual Stresses in Ground Steels, Met. Trans. A, 11A:159 (1980).Google Scholar
6. Neerfeld, H., The Calculation of Stress from X-Ray Elongation Measurements, Mitt. KWI Eisenforsch., 24:61 (1942).Google Scholar
7. Kroner, E., Berechnung der elastischen Konstanten des Vielkristalls aus den Konstanten des Einkristalls, Z. Physik, 151:504 (1958).Google Scholar
8. Brakman, C.M., Residual Stresses in Cubic Materials with Orthorhombic or Monoclinic Specimen Symmetry:Influence of Texture on ψ-Splitting and Non-linear Behaviour, J. Appl. Crystall., 16:325 (1983).Google Scholar
9. Noyan, I.C. and Cohen, J.B., Determining Stresses in the Presence of Non-linearities in Interplanar Spacing vs. sin2ψ-this volume.Google Scholar
10. Volk, W., “Applied Statistics for Engineers”, McGraw-Hill Book Co., New York City (1958).Google Scholar
11. James, M.R. and Cohen, J.B., The Measurement of Residual Stresses by X-Ray Diffraction Techniques, Treatise on Materials Science and Technology, 19A:1 (1980).Google Scholar
12. Society of Automotive Engineers, “Residual Stress Measurement by X-Ray Diffraction”, SAE Handbook J784a, 2nd. ed., Soc. Auto. Eng., Inc., New York City (1978).Google Scholar
13. Kolb, K. and Maaherauch, E., Der Anisotropie einfluss rontgenographische Gitterdehnungsmessungen an Nickel, Z. Physik, 162:119 (1961).Google Scholar
14. Esquivel, A.L., X-Ray Diffraction Study of the Effects of Uniaxial Plastic Deformation on Residual Stress Measurements, Adv. in X-Ray Anal., 12:269 (1969). 15-Marion, R.H. and Cohen, J.B., The Need for Experimentally Determined X-Ray Elastic Constants, Adv. in X-Ray Anal., 20:355 (1977).Google Scholar
16. James, M.R. and Cohen, J.B., The Application of a Position Sensitive X-Ray Detector to the Measurement of Residual Stresses, Adv. in X-Ray Anal., 19:695 (1976).Google Scholar