Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T15:05:17.416Z Has data issue: false hasContentIssue false
  • English
  • Français

Measurement of “Chemical Shift” by an Automated Commercial X-ray Fluorescence Spectrometer

Published online by Cambridge University Press:  06 March 2019

L. G. Dowell ,
J. M. Bennet  and
D. E. Passoja
L. G. Dowell
Affiliation:
Union Carbide Corporation Tarrytown, New York 10591
J. M. Bennet
Affiliation:
Union Carbide Corporation Tarrytown, New York 10591
D. E. Passoja
Affiliation:
Union Carbide Corporation Tarrytown, New York 10591
Get access

Extract

The measurement of “chemical shift,” that is, the change in energy of an element's x-ray emission lines with the state of its chemical combination, has been carried out for some years. Of the three major aspects of the technique, two have received major attention. Nagel (1) has an excellent treatise on the interpretation of valence band x-ray spectra, while such workers as Fischer (2) and Koffman and Moll (3) have attempted to correlate the data with structure. The third area, convenient data collection, has not been so well investigated. Much, but not all, of the effort has been toward direct electron excitation with its attendant problems of sample damage due to high vacuum and electron bombardment effects.

Type
X-Ray Fluorescence
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 471 - 479
Copyright
Copyright © International Centre for Diffraction Data 1976

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Nagel, D. L., “Interpretation of Valence Band X-Ray Spectra”, in Mueller, W. M., Editor, Advances in X-Ray Analysis, Vol. 13, p. 182–236, Plenum Press (1969).Google Scholar
2. Fischer, D. W., “Chemical Bonding and Valence State -- Nonmetals”, ibid, p. 159–181, Plenum Press (1969).Google Scholar
3. Koffman, D. M. and Moll, S. H., “The Effect of Chemical Combination on the X-Ray Spectra of Silicon”, in Mueller, W. M., Editor, Advances in X-Ray Analysis, Vol, 9, p. 323–328, Plenum Press (1965).Google Scholar
4. Kuhl, G. H., “A Study of Aluminum Coordination in Zeolites Using the Kβ Line”, in Proceedings of Third International Conference on Molecular Sieves”, p. 227, Leuven Press (1973).Google Scholar
5. Tossel, J. A., “The Electronic Structures of Mg, Al and Si in Octahedral Coordination with Oxygen from SCF Xα MO Calculations”, J. Phys. Chem. Solids 36, 1273-1280 (1975).Google Scholar
6. Klug, H. P. and Alexander, L. E., X-Ray Diffraction Procedures, Second Edition, p. 635, John Wiley and Sons (1974).Google Scholar