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Low-Temperature X-Ray Diffraction of Frozen Electrolytes

Published online by Cambridge University Press:  06 March 2019

H.J. Weltman
H.J. Weltman*
Affiliation:
Convair, Forth Worth, Texas
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Abstract

A low-temperature X-ray diffraction apparatus has been constructed to study structure and structural changes of electrolytes in the frozen state. This apparatus, which is inexpensive and easy to construct, is an attachment to a standard wide-angle diffractometer. Diffraction patterns may be obtained of various types of materials at any temperature from room temperature to −196°C with a control of ±1°C. The diffraction patterns are recorded on a strip-chart recorder as they are being obtained. Thus, this diffractometer method has several advantages over the camera methods usually employed for low-temperature X-ray diffraction work. A unique sample-introduction method is described which ensures a polycrystalline material suitable for obtaining diffraction patterns. Such patterns are shown for various concentrations of salts in water at several low temperatures, phase transformations being in evidence.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 48 - 56
Copyright
Copyright © International Centre for Diffraction Data 1961

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