Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-25T02:18:52.144Z Has data issue: false hasContentIssue false
  • English
  • Français

Lattice Defect Research by Kossel Technique and Deformation Analysis

Published online by Cambridge University Press:  06 March 2019

Masataka Umeno ,
Hideaki Kawabe  and
Gunji Shinoda
Masataka Umeno
Affiliation:
Osaka University, Miyakojima, Osaka, Japan
Hideaki Kawabe
Affiliation:
Osaka University, Miyakojima, Osaka, Japan
Gunji Shinoda
Affiliation:
Osaka University, Miyakojima, Osaka, Japan
Get access

Abstract

An electron probe microanalyzer (EPMA) was applied for the deformation analysis of aluminum single crystals. The lattice distortions caused by tensile stresses were observed by Kossel patterns, which are sensitive in their change of shape to lattice distortion. The effects of lattice distortion would appear as splitting, tearing, bending, broadening, disappearance, and shift of Kossel lines. This distortion behavior can be analyzed successfully. The jnhomogeneities and anisotropy appearing on every line were explained by the crystallographic cons (deration of slip mechanisms. The lattice distortions and corresponding changes in Kossel patterns depend on the direction of elongation ; the deformation modes of those crystals which show typical fee behavior in stress-strain curves can be reasonably explained by a fragmentation model. It was also found that there are some portions in Kossel patterns where some specific Kossel lines, i.e., {200} and {111}, are very sensitive to lattice deformation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 23 - 34
Copyright
Copyright © International Centre for Diffraction Data 1965

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Castaing, R., Thesis, University of Paris, 1951.Google Scholar
2. Fujiwara, T., J. Sci. Hiroshima Univ. Ser. C7: 179, 1937.Google Scholar
3. Lonsdale, K., “Divergent-Beam X-Ray Photography of Crystals,” Phil. Trans. Roy, Soc. London 240: 219, 1947.Google Scholar
4. Geisler, A. H., Hill, J. K., and Newkirk, J. B., “Divergent Beam. X-Ray Photography with Standard Diffraction Equipment,” J. Appl. Phys. 19: 1041, 1948.Google Scholar
5. Imura, T., Weissmann, S., and Slade, J. J. Jr., “A Study of Age-Hardening of Al-3.85% Cu by the Divergent X-Ray Beam Method,” Acta Cryst. 15: 786, 1962.Google Scholar
6. Weissmann, S. and Nakajima, K., “Defect Structure and Density Decrease in Neutron-Irradiated Quartz,” J. Appl. Phys. 34: 611, 1963.Google Scholar
7. Ellis, T., Nanni, L. F., Shrier, A., Weissmann, S., Padawer, G. E., and Hosokawa, N., “Strain and Precision Lattice Parameter Measurement by the X-Ray Divergent Beam Method. I,” J. Appl. Phys. 35: 3364, 1964.Google Scholar
8. Hanoeman, R. E., Ogilvie, R. E., and Modraejewski, A., “Kossel Line Studies of Irradiated Nickel Crystals,” J. Appl. Phys. 33: 1429, 1962.Google Scholar
9. Heise, B. H., “Precision Determination of the Lattice Constant by the Kossel Line Technique,” J. Appl. Pays. 33: 938, 1962,Google Scholar
10. Gielen, P., Yakowitz, H., Ganow, D., and Ogilvie, R. E., “Evaluation of Kossel Microd Effraction Procedures; The Cubic Case,” J. Appl. Phys. 36: 773, 1965.Google Scholar
11. Shinoda, G. and Amano, Y., “X-Ray Investigation on Artificially Prepared Jewels. Part I,” X-Sen 6: 7–13, 1949 (in Japanese).Google Scholar
12. Amano, Y., Thesis, Osaka University, 1960.Google Scholar
13. Imura, Tohoru, “Study of the Deformation of Single Crystals by Divergent X-Ray Beams,” Butt. Naniwa University, Set. 2A: 51–70, 1954.Google Scholar
14. Imura, Tohoru, “A Study on the Deformation of Single Crystals by Divergent X-Ray Beams (Part III), Bull. Univ. Osaka Prefect. Ser. 5A: 99–120, 1957.Google Scholar