Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-23T11:54:55.311Z Has data issue: false hasContentIssue false
  • English
  • Français

JCPDS-lnternational Centre for Diffraction Data Low-Angle Powder Diffraction Study of Silver Behenate

Published online by Cambridge University Press:  06 March 2019

T. Blanton ,
T. Huang ,
H. Toraya ,
C. Hubbard ,
S. Robie ,
D. Louër ,
H. Göbel ,
G. Will ,
R. Gilles  and
T. Raftery
T. Blanton
Affiliation:
Eastman Kodak Company
T. Huang
Affiliation:
IBM Research Division
H. Toraya
Affiliation:
Nagoya Institute of Technology
C. Hubbard
Affiliation:
Oak Ridge National Laboratories
S. Robie
Affiliation:
Scintag Incorporated
D. Louër
Affiliation:
Universite de Rennes
H. Göbel
Affiliation:
Siemens AG
G. Will
Affiliation:
University of Bonn
R. Gilles
Affiliation:
University of Bonn
T. Raftery
Affiliation:
Queensland University of Technology
Get access

Abstract

As a result of interest in the characterization of materials with large d-spacings and layer periodicities, it has become necessary to develop a low-angle diffraction material which has welldefined diffraction peaks down to very small 2θ angles. The use of silver behenate, CH3(CH2)20COO-Ag, was introduced by one of the authors (TB) at the 1991 International Centre for Diffraction Data (ICDD) Annual Meeting and was shown to have a set of well-defined (001) diffraction peaks down to 1.5° 2θ when using CuKα radiation. The silver behenate diffraction peaks were observed to be slightly asymmetric with relatively long tails at the low angle side of the peaks. The average crystallite size along the c-axis was estimated using the Scherrer equation and was found to be 900 Å.

A task group of the JCPDS-ICJDD Data Collection and Analysis Subcommittee was established with the charge of investigating the use of silver behenate as a possible low-angle calibration material for diffraction applications. Utilizing several data collection and data analysis techniques, d001 long-period spacings in the range of 58.219-58.480 Å were obtained. Using the same collected data and one data analysis refinement calculation method resulted in long-period spacing with a range of 58.303-58.425 Å. Data collected using a silicon internal standard and the same singular data analysis calculation method provided d001 values with a range of 58.363-58.381 Å.

The formation of a full-range 2θ diffraction sample was also investigated. Silver behenate and inorganic powders were mixed with an epoxy binder to form a permanent sample which provides diffraction peaks over the entire 2θ range of a powder diffractometer.

Type
II. Phase Analysis, Accuracy and Standards in Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 99 - 105
Copyright
Copyright © International Centre for Diffraction Data 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Wong-Ng, W. and Hubbard, C.R., Powder Diffr., 2, 242–248 (1987).Google Scholar
2. Hubbard, C.R., “Advances in X-ray Analysis, Volume 26,” Barrett, C.S, ed., Plenum Press, New York, 45–51 (1983).Google Scholar
3. Dragoo, A.L., Powder Diffr., 1, 294–298 (1986).Google Scholar
4. Matthews, F.W., Warren, G.G., Michell, J.H., Anal. Chem., 22, 514–519 (1950).Google Scholar
5. Huang, T.C., Toraya, H., T.N. Blanton, Y. W., J. Appl. Cryst., 26, 180–184 (1993).Google Scholar
6. Blanton, T.N., Huang, T.C., Toraya, H., Hubbard, C.R., Robie, S.B., Louer, D., Gobel, H.E., Will, G., Gilles, R., Raftery, T., Powder Diffr., 10(1), in print (1995).Google Scholar
7. Toraya, H. and Kitamura, M., J. Appl. Cryst., 23, 282–285 (1990).Google Scholar
8. Toraya, H., J. Appl. Cryst., 26, 583–590 (1993).Google Scholar