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Integrated X-Ray Diffraction Intensities from Single Crystals

Published online by Cambridge University Press:  06 March 2019

Henry Chessin
Henry Chessin*
Affiliation:
United States Steel Corporation Research Center Monroeville, Pennsylvania
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Abstract

The advantages and accuracy of counter equipment for the measurement of the intensity of scattered X-rays from small single crystals are discussed and illustrated. Several precautions necessary to obtain reliable intensity measurements are discussed. The equi-inclination method of inspecting all accessible reflections is treated in detail. The practicality of the stationary crystal method for determining integrated intensities, in principle the most accurate and rapid method, is demonstrated. Suggestions for improving the accuracy and speed of collecting data are made.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 3: Eighth Annual Conference on Applications of X-ray Analysis, August 12-14, 1959 , 1959 , pp. 255 - 267
Copyright
Copyright © International Centre for Diffraction Data 1959

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Footnotes

This paper was presented at the Seventh Annual Conference. Approval for publication was received too late for inclusion in the Proceedings of that conference.

References

1 Bragg, W. H., Phil. Mag., Vol. 27, 1914, p. 881.Google Scholar
2 Lonsdale, K., Acta Cryst., Vol. 1, 1948, p. 12.Google Scholar
3 Cochran, W., Acta Cryst., Vol. 3, 1950, p. 268.Google Scholar
4 Birks, L. S. and Wing, A. B., NRL Report 4402, Naval Research Laboratory, Washington, D.C., 1954.Google Scholar
5 Jeffrey, G. A., Pringle, G. E., and Townsend, J. R., “Equipment for X-ray Crystal Structure Analysis,” Final Report from Scaife Radiation Laboratory, University of Pittsburgh, Pittsburgh, Pa., 1955.Google Scholar
6 Evans, H. T., Jr., Rev. Sci. Instr., Vol. 24, 1953, p. 156.Google Scholar
7 McLachlan, D., Clifton, D. F., and Filler, A., Rev. Sci. Instr., Vol. 22, 1951, p. 1024.Google Scholar
8 Furnas, T. C., Jr., and Marker, D., Rev. Sci. Instr., Vol. 26, 1955, p. 449.Google Scholar
9 Bond, W. L., Abstracts of Communications, Fourth Congress of the International Union of Crystallography, 1957, p. 741.Google Scholar
10 Buerger, M. J., X-ray Crystallography, Chapter 14, John Wiley and Sons, Inc., New York, 1942.Google Scholar
11 DuMond, J. W. M. and Kirkpatrick, H. A., Phys, Rev., Vol. 37, 1931, p. 136.Google Scholar
12 Gerlach, W., Physik. Z., Vol. 23, 1922, p. 114.Google Scholar
13 Richtmyer, F. K., Phys. Rev., Vol. 26, 1925, p. 724.Google Scholar
14 Cochran, W., J. Sci. Instr., Vol. 25, 1948, p. 253.Google Scholar